Marco Restifo

According to our database, Marco Restifo authored at least 15 papers between 2017 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Reliability and Testing of Complex Safety-Critical Automotive SoC.

Marco Restifo

PhD thesis, 2020

Applicative System Level Test introduction to Increase Confidence on Screening Quality.

Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali

Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

2019

Innovative Practices on Automotive Test.

Wim Dobbelaere, Marco Restifo, Peter Sarson

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

A Hybrid In-Field Self-Test Technique for SoCs.

Sara Carbonara, Paolo Bernardi, Marco Restifo

Proceedings of the 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2019

Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test.

F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi

Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

2018

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In.

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini

J. Low Power Electron., 2018

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC.

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini

J. Electron. Test., 2018

An Optimized Test During Burn-In for Automotive SoC.

Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini

IEEE Des. Test, 2018

About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications.

Riccardo Cantoro, Andrea Firrincieli, Davide Piumatti, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

A DMA and CACHE-based stress schema for burn-in of automotive microcontroller.

Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

On the in-field test of embedded memories.

Paolo Bernardi, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Scan chain encryption for the test, diagnosis and debug of secure circuits.

Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo

Proceedings of the 22nd IEEE European Test Symposium, 2017

On-line software-based self-test for ECC of embedded RAM memories.

Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

An evolutionary approach to hardware encryption and Trojan-horse mitigation.

Andrea Marcelli, Marco Restifo, Ernesto Sánchez, Giovanni Squillero

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC.

Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017