Michél Simon-Najasek

According to our database, Michél Simon-Najasek authored at least 12 papers between 2012 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress.

Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause, Andreas Graff, Michél Simon-Najasek

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.

Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.

Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology.

Maximilian Dammann, Martina Baeumler, Peter Brückner, Tobias Kemmer, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay

Microelectron. Reliab., 2018

Physical failure analysis methods for wide band gap semiconductor devices.

Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.

Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck

Microelectron. Reliab., 2017

Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.

Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek

Microelectron. Reliab., 2017

2016

Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.

Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann

Microelectron. Reliab., 2016

Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.

Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck

Microelectron. Reliab., 2016

Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy.

Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann

Microelectron. Reliab., 2016

2014

Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.

Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff

Microelectron. Reliab., 2014

2012

Novel techniques for dopant contrast analysis on real IC structures.

Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann

Microelectron. Reliab., 2012