Nima Kolahimahmoudi

Orcid: 0009-0004-4575-0558

According to our database1, Nima Kolahimahmoudi authored at least 4 papers between 2022 and 2025.

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Bibliography

2025
Device-Aware Test for Threshold Voltage Shifting in FeFET.
Proceedings of the IEEE International Test Conference, 2025

2024
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements.
Proceedings of the IEEE International Conference on Design, 2024

2023
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test.
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

2022
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries.
Proceedings of the IEEE European Test Symposium, 2022


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