P. Packan

According to our database, P. Packan authored at least 4 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

An Intel 3 Advanced FinFET Platform Technology for High Performance Computing and SOC Product Applications.

Walid M. Hafez, D. Abanulo, M. Abdelkader, S. An, C. Auth, D. Bahr, V. Balakrishnan, Rohan Bambery, M. Beck, M. Bhargava, S. Bhowmick, J. Biggs-houck, J. Birdsall, D. Caselli, H.-Y. Chang, Y. Chang, R. Chaudhuri, S. Chauhan, C. Chen, V. Chikarmane, K. Chikkadi, T. Chu, C. Connor, R. De Alba, Y. Deng, C. Destefano, D. Diana, Y. Dong, P. Elfick, Tyler Elko-Hansen, B. Fallahazad, Y. Fang, D. Gala, D. Garg, C. Geppert, S. Govindaraju, W. Grimm, H. Grunes, L. Guler, Z. Guo, A. Gupta, M. Hattendorf, S. Havelia, J. Hazra, A. Islam, A. Jain, S. Jaloviar, M. Jamil, M. Jang, M. Kabir, J. Kameswaran, Eric Karl, S. Kelgeri, A. Kennedy, C. Kilroy, J. Kim, Y. Kim, D. Krishnan, G. Lee, H.-P. Lee, Q. Li, H. Lin, A. Luk, Y. Luo, P. Macfarlane, A. Mamun, K. Marla, D. Mayeri, E. Mckenna, A. Miah, K. Mistry, M. Mleczko, S. Moon, D. Nardi, S. Natarajan, J. Nathawat, C. Nolph, C. Nugroho, P. Nyhus, A. Oni, P. Packan, D. Pak, A. Paliwal, R. Pandey, I. Paredes, K. Park, L. Paulson, A. Pierre, P. Plekhanov, C. Prasad, R. Ramaswamy, J. Riley, Johann Rode, R. Russell, S. Ryu, H. Saavedra, T. Salisbury, Justin Sandford, F. Shah, K. Shang, P. Shekhar, A. Shu, E. Skoug, J. Sohn, J. Song, M. Sprinkle, J. Su, A. Tan, T. Troeger, R. Tsao, A. Vaidya, C. Wallace, X. Wang, H. Wang, C. Ward, S. Wickramaratne, M. Wills, T. Wu, Z. Xia-hua, S. Xu, P. Yashar, J. Yaung, Y. Yu, M. Zilm, Bernhard Sell

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Intel PowerVia Technology: Backside Power Delivery for High Density and High-Performance Computing.

Walid M. Hafez, P. Agnihotri, M. Asoro, M. Aykol, B. Bains, Rohan Bambery, M. Bapna, A. Barik, A. Chatterjee, P. C. Chiu, T. Chu, C. Firby, K. Fischer, M. Fradkin, Hannes Greve, A. Gupta, E. Haralson, M. Haran, Jeffery Hicks, A. Illa, M. Jang, S. Klopcic, M. Kobrinsky, B. Kuns, H.-h. Lai, G. Lanni, S.-H. Lee, N. Lindert, C.-l. Lo, Y. Luo, G. Malyavanatham, B. Marinkovic, Y. Maymon, M. Nabors, J. Neirynck, P. Packan, A. Paliwal, L. Pantisano, Leif Paulson, Padma Penmatsa, Chetan Prasad, Conor Puls, T. Rahman, R. Ramaswamy, S. Samant, Bernhard Sell, K. Sethi, F. Shah, M. Shamanna, K. Shang, Q. Li, M. Sibakoti, J. Stoeger, Nathan Strutt, R. Thirugnanasambandam, C. Tsai, X. Wang, A. Wang, S.-j. Wu, Q. Xu, X.-h. Zhong, S. Natarajan

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2022

Intel 4 CMOS Technology Featuring Advanced FinFET Transistors optimized for High Density and High-Performance Computing.

Bernhard Sell, S. An, J. Armstrong, D. Bahr, B. Bains, Rohan Bambery, K. Bang, D. Basu, S. Bendapudi, D. Bergstrom, R. Bhandavat, S. Bhowmick, M. Buehler, D. Caselli, S. Cekli, Vrsk. Chaganti, Y. J. Chang, K. Chikkadi, T. Chu, T. Crimmins, G. Darby, C. Ege, P. Elfick, Tyler Elko-Hansen, S. Fang, C. Gaddam, M. Ghoneim, H. Gomez, S. Govindaraju, Z. Guo, Walid M. Hafez, M. Haran, M. Hattendorf, S. Hu, A. Jain, S. Jaloviar, M. Jang, J. Kameswaran, V. Kapinus, A. Kennedy, S. Klopcic, D. Krishnan, J. Leib, Y.-T. Lin, N. Lindert, G. Liu, O. Loh, Y. Luo, S. Mani, M. Mleczko, S. Mocherla, P. Packan, M. Paik, A. Paliwal, R. Pandey, K. Patankar, L. Pipes, P. Plekhanov, Chetan Prasad, M. Prince, G. Ramalingam, R. Ramaswamy, J. Riley, J. R. Sanchez Perez, Justin Sandford, A. Sathe, F. Shah, H. Shim, S. Subramanian, S. Tandon, M. Tanniru, D. Thakurta, T. Troeger, X. Wang, C. Ward, A. Welsh, S. Wickramaratne, J. Wnuk, S. Q. Xu, P. Yashar, J. Yaung, K. Yoon, N. Young

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

2015

Transistor aging and reliability in 14nm tri-gate technology.

Steven R. Novak, C. Parker, D. Becher, M. Liu, Marty Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan

Proceedings of the IEEE International Reliability Physics Symposium, 2015