Peter Hazucha

According to our database1, Peter Hazucha authored at least 16 papers between 2000 and 2009.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2009
A Delay-Locked Loop Synchronization Scheme for High-Frequency Multiphase Hysteretic DC-DC Converters.
IEEE J. Solid State Circuits, 2009

2008
A Band-Limited Active Damping Circuit With 13 dB Power Supply Resonance Reduction.
IEEE J. Solid State Circuits, 2008

2007
High Voltage Tolerant Linear Regulator With Fast Digital Control for Biasing of Integrated DC-DC Converters.
IEEE J. Solid State Circuits, 2007

On-Die Supply-Resonance Suppression Using Band-Limited Active Damping.
Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

Low Voltage Buffered Bandgap Reference.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006
High-voltage power delivery through charge recycling.
IEEE J. Solid State Circuits, 2006

A Linear Regulator with Fast Digital Control for Biasing Integrated DC-DC Converters.
Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

High-frequency DC-DC conversion : fact or fiction.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005
A 233-MHz 80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package.
IEEE J. Solid State Circuits, 2005

Area-efficient linear regulator with ultra-fast load regulation.
IEEE J. Solid State Circuits, 2005

2004
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes.
IEEE Trans. Dependable Secur. Comput., 2004

Measurements and analysis of SER-tolerant latch in a 90-nm dual-V<sub>T</sub> CMOS process.
IEEE J. Solid State Circuits, 2004

Feasibility of monolithic and 3D-stacked DC-DC converters for microprocessors in 90nm technology generation.
Proceedings of the 2004 International Symposium on Low Power Electronics and Design, 2004

2003
Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2000
Cosmic-ray soft error rate characterization of a standard 0.6-μm CMOS process.
IEEE J. Solid State Circuits, 2000

Optimized test circuits for SER characterization of a manufacturing process.
IEEE J. Solid State Circuits, 2000


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