Sangchul Shin

According to our database1, Sangchul Shin authored at least 8 papers between 2005 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2019
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

A systematic study of gate dielectric TDDB in FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Optimal design of dummy ball array in wafer level package to improve board level thermal cycle reliability (BLR).
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2006
End-to-End QoS Monitoring Tool Development and Performance Analysis for NGN.
Proceedings of the Management of Convergence Networks and Services, 2006

2005
Scalable and Reliable Overlay Multicast Network for Live Media Streaming.
Proceedings of the Advances in Multimedia Information Processing, 2005


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