Soonyoung Lee
Orcid: 0009-0005-0764-337X
According to our database1,
Soonyoung Lee
authored at least 25 papers
between 2008 and 2025.
Collaborative distances:
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Bibliography
2025
CoRR, July, 2025
ChatEXAONEPath: An Expert-level Multimodal Large Language Model for Histopathology Using Whole Slide Images.
CoRR, April, 2025
Pattern Recognit. Lett., 2025
AURA-Depth: Attention-Based Uncertainty Reduction and Feature Aggregation Depth Network.
IEEE Access, 2025
ReSpec: Relevance and Specificity Grounded Online Filtering for Learning on Video-Text Data Streams.
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2025
MASH-VLM: Mitigating Action-Scene Hallucination in Video-LLMs through Disentangled Spatial-Temporal Representations.
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2025
2024
CoRR, 2024
Proceedings of the Computer Vision - ECCV 2024, 2024
Proceedings of the Findings of the Association for Computational Linguistics, 2024
2023
Universal Noise Annotation: Unveiling the Impact of Noisy annotation on Object Detection.
CoRR, 2023
2022
CEDe: A collection of expert-curated datasets with atom-level entity annotations for Optical Chemical Structure Recognition.
Proceedings of the Advances in Neural Information Processing Systems 35: Annual Conference on Neural Information Processing Systems 2022, 2022
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022
2021
FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications.
IEEE Access, 2021
2019
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation.
Microelectron. Reliab., 2017
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2014
IEEE Trans. Computers, 2014
2012
Proceedings of the 21st IEEE Asian Test Symposium, 2012
2008
New smith predictor control using disturbance observer for steam superheater and steam pressure of the boiler.
Proceedings of the 10th International Conference on Control, 2008