Abhishek Koneru

According to our database, Abhishek Koneru authored at least 17 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Disruptive Changes in Field Equation Modeling: A Simple Interface for Wafer Scale Engines.

Mino Woo, Terry Jordan, Robert Schreiber, Ilya Sharapov, Shaheer Muhammad, Abhishek Koneru, Michael James, Dirk Van Essendelft

CoRR, 2022

2020

An Interlayer Interconnect BIST and Diagnosis Solution for Monolithic 3-D ICs.

Abhishek Koneru, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

2019

A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits.

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs.

Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits.

Abhishek Koneru, Krishnendu Chakrabarty

Proceedings of the 2019 on Great Lakes Symposium on VLSI, 2019

2018

Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress.

Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

An inter-layer interconnect BIST solution for monolithic 3D ICs.

Abhishek Koneru, Krishnendu Chakrabarty

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation.

Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty

Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018

2017

Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits.

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty

ACM J. Emerg. Technol. Comput. Syst., 2017

A Design-for-Test Solution for Monolithic 3D Integrated Circuits.

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty

Proceedings of the 2017 IEEE International Conference on Computer Design, 2017

Design automation and testing of monolithic 3D ICs: Opportunities, challenges, and solutions: (Invited paper).

Kyungwook Chang, Abhishek Koneru, Krishnendu Chakrabarty, Sung Kyu Lim

Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017

2016

Online soft-error vulnerability estimation for memory arrays.

Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing.

Abhishek Koneru, Krishnendu Chakrabarty

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Accurate Analysis and Prediction of Enterprise Service-Level Performance.

Qing Duan, Abhishek Koneru, Jun Zeng, Krishnendu Chakrabarty, Gary Dispoto

ACM Trans. Design Autom. Electr. Syst., 2015

Self-awareness and self-learning for resiliency in real-time systems.

Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure.

Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

Re-using BIST for circuit aging monitoring.

Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the 20th IEEE European Test Symposium, 2015