Mojtaba Ebrahimi

According to our database, Mojtaba Ebrahimi authored at least 58 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

A mixed-model assembly line sequencing problem with parallel stations and walking workers: a case study in the automotive industry.

Mojtaba Ebrahimi, Mehdi Mahmoodjanloo, Behnam Einabadi, Armand Baboli, Eva Rother

Int. J. Prod. Res., February, 2023

A Comprehensive Method for Measuring Flexibility at the Individual and Global Levels: A Case Study in the Automotive Industry.

Anthony Chehami, Armand Baboli, Eva Rother, Behnam Einabadi, Mojtaba Ebrahimi

Proceedings of the 9th International Conference on Control, 2023

Multi-Finger 250-nm InP/GaAsSb DHBTs with Record 37.3 % Class-A PAE at 94 GHz.

Sara Hamzeloui, Akshay M. Arabhavi, Filippo Ciabattini, Mojtaba Ebrahimi, Markus Müller, Olivier Ostinelli, Michael Schröter, Colombo R. Bolognesi

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023

Thermal Characterization of InP/GaAsSb DHBTs: Effect of Emitter and Collector Layers.

F. Ciabattini, Akshay M. Arabhavi, Sara Hamzeloui, Mojtaba Ebrahimi, Olivier Ostinelli, Colombo R. Bolognesi

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023

2022

Determination and Prioritization of Flexibility Types in the Context of Industry 4.0: A Use Case in Automotive Industry.

Anthony Chehami, Armand Baboli, Behnam Einabadi, Mojtaba Ebrahimi, Eva Rother

Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2022

Highly-Linear InP/GaAsSb DHBTs with 18.2 dBm OIP3 at 45 GHz: Comparison of Common-Base and Common-Emitter Structures.

Sara Hamzeloui, Filippo Ciabattini, Akshay M. Arabhavi, W. Quan, Diego Marti, Mojtaba Ebrahimi, Olivier Ostinelli, Colombo R. Bolognesi

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2020

Selective Flip-Flop Optimization for Reliable Digital Circuit Design.

Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

2018

Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores.

Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017

Bias Temperature Instability Mitigation via Adaptive Cache Size Management.

Nezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori

IEEE Trans. Very Large Scale Integr. Syst., 2017

Temperature-Aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing.

Saman Kiamehr, Mojtaba Ebrahimi, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori

IEEE Trans. Very Large Scale Integr. Syst., 2017

Aging-aware coding scheme for memory arrays.

Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori

Proceedings of the 22nd IEEE European Test Symposium, 2017

Opportunistic write for fast and reliable STT-MRAM.

Nour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies.

Mojtaba Ebrahimi

PhD thesis, 2016

Low-Cost Multiple Bit Upset Correction in SRAM-Based FPGA Configuration Frames.

Mojtaba Ebrahimi, Parthasarathy Murali B. Rao, Razi Seyyedi, Mehdi Baradaran Tahoori

IEEE Trans. Very Large Scale Integr. Syst., 2016

Self-Timed Read and Write Operations in STT-MRAM.

Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

IEEE Trans. Very Large Scale Integr. Syst., 2016

Reliability-Aware Resource Allocation and Binding in High-Level Synthesis.

Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

ACM Trans. Design Autom. Electr. Syst., 2016

Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing.

Guillaume Prenat, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Nathalie Lamard, Olivier Boulle, Kevin Garello, Juergen Langer, Berthold Ocker, Marie Claire Cyrille, Pietro Gambardella, Mehdi Baradaran Tahoori, Gilles Gaudin

IEEE Trans. Multi Scale Comput. Syst., 2016

Layout-Based Modeling and Mitigation of Multiple Event Transients.

Mojtaba Ebrahimi, Hossein Asadi, Rajendra Bishnoi, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Online soft-error vulnerability estimation for memory arrays.

Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Revisiting software-based soft error mitigation techniques via accurate error generation and propagation models.

Mojtaba Ebrahimi, Maryam Rashvand, Firas Kaddachi, Mehdi Baradaran Tahoori, Giorgio Di Natale

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing.

Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 2016

System-level reliability evaluation through cache-aware software-based fault injection.

Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Variation-aware near threshold circuit synthesis.

Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Invited - Cross-layer approaches for soft error modeling and mitigation.

Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 53rd Annual Design Automation Conference, 2016

Fault injection acceleration by simultaneous injection of non-interacting faults.

Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori

Proceedings of the 53rd Annual Design Automation Conference, 2016

2015

Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy.

Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor.

Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Application-aware cross-layer reliability analysis and optimization.

Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis

it Inf. Technol., 2015

Extending standard cell library for aging mitigation.

Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori

IET Comput. Digit. Tech., 2015

Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths.

Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

J. Electron. Test., 2015

Stepped parity: A low-cost multiple bit upset detection technique.

Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 2015 IEEE International Test Conference, 2015

Cross-layer resilient system design flow.

Fabian Oboril, Mojtaba Ebrahimi, Saman Kiamehr, Mehdi Baradaran Tahoori

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Improving reliability, performance, and energy efficiency of STT-MRAM with dynamic write latency.

Ali Ahari, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori

Proceedings of the 33rd IEEE International Conference on Computer Design, 2015

Energy efficient partitioning of dynamic reconfigurable MRAM-FPGAs.

Ali Ahari, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 25th International Conference on Field Programmable Logic and Applications, 2015

Aging guardband reduction through selective flip-flop optimization.

Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 20th IEEE European Test Symposium, 2015

Reliability-aware operation chaining in high level synthesis.

Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 20th IEEE European Test Symposium, 2015

Protecting caches against multi-bit errors using embedded erasure coding.

Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt

Proceedings of the 20th IEEE European Test Symposium, 2015

Fault injection acceleration by architectural importance sampling.

Mojtaba Ebrahimi, Nour Sayed, Maryam Rashvand, Mehdi Baradaran Tahoori

Proceedings of the 2015 International Conference on Hardware/Software Codesign and System Synthesis, 2015

Aging mitigation in memory arrays using self-controlled bit-flipping technique.

Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

Event-driven transient error propagation: A scalable and accurate soft error rate estimation approach.

Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, Mehdi Baradaran Tahoori

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

A fast, flexible, and easy-to-develop FPGA-based fault injection technique.

Mojtaba Ebrahimi, Abbas Mohammadi, Alireza Ejlali, Seyed Ghassem Miremadi

Microelectron. Reliab., 2014

Towards Cross-layer Reliability Analysis of Transient and Permanent Faults.

Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Michael Glaß, Faramarz Khosravi, Mehdi Baradaran Tahoori

CoRR, 2014

Read disturb fault detection in STT-MRAM.

Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori

Proceedings of the 2014 International Test Conference, 2014

Avoiding unnecessary write operations in STT-MRAM for low power implementation.

Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

Quantitative evaluation of register vulnerabilities in RTL control paths.

Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the 19th IEEE European Test Symposium, 2014

Aging-aware standard cell library design.

Saman Kiamehr, Farshad Firouzi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.

Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Asynchronous Asymmetrical Write Termination (AAWT) for a low power STT-MRAM.

Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes.

Parthasarathy M. B. Rao, Mojtaba Ebrahimi, Razi Seyyedi, Mehdi Baradaran Tahoori

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

Architectural aspects in design and analysis of SOT-based memories.

Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

2013

Low-Cost Scan-Chain-Based Technique to Recover Multiple Errors in TMR Systems.

Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Hossein Asadi, Mahdi Fazeli

IEEE Trans. Very Large Scale Integr. Syst., 2013

CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis.

Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori

J. Electron. Test., 2013

Chip-level modeling and analysis of electrical masking of soft errors.

Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Aging-aware logic synthesis.

Mojtaba Ebrahimi, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

A layout-based approach for multiple event transient analysis.

Mojtaba Ebrahimi, Hossein Asadi, Mehdi Baradaran Tahoori

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

CLASS: Combined logic and architectural soft error sensitivity analysis.

Mojtaba Ebrahimi, Liang Chen, Hossein Asadi, Mehdi Baradaran Tahoori

Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013

2012

SCFIT: A FPGA-based fault injection technique for SEU fault model.

Abbas Mohammadi, Mojtaba Ebrahimi, Alireza Ejlali, Seyed Ghassem Miremadi

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

ScTMR: A scan chain-based error recovery technique for TMR systems in safety-critical applications.

Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Hossein Asadi

Proceedings of the Design, Automation and Test in Europe, 2011