Andrew Richardson

According to our database, Andrew Richardson authored at least 36 papers between 1988 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Self-Monitoring, Self-Healing Biomorphic Sensor Technology.

Andrew Richardson, David Cheneler

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2013

Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems.

Qais Al-Gayem, Hong Liu, Haroon Khan, Andrew Richardson

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2011

An Oscillation-Based Technique for Degradation Monitoring of Sensing and Actuation Electrodes Within Microfluidic Systems.

Qais Al-Gayem, Andrew Richardson, Hongyuan Liu, Nick Burd

J. Electron. Test., 2011

Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems.

Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd

J. Electron. Test., 2011

2010

An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.

Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd, M. Kumar

Proceedings of the 2011 IEEE International Test Conference, 2010

A multi-mode MEMS sensor design to support system test and health & usage monitoring applications.

Z. Xu, Andrew Richardson, Lijie Li, Mark L. Begbie, D. Koltsov, C. H. Wang

Proceedings of the 15th European Test Symposium, 2010

2009

Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems.

Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd

Proceedings of the 14th IEEE European Test Symposium, 2009

2008

A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data.

Hans G. Kerkhoff, Xiao Zhang, Frédérick Mailly, Pascal Nouet, Hongyuan Liu, Andrew Richardson

VLSI Design, 2008

Online Testing of MEMS Based on Encoded Stimulus Superposition.

Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson

J. Electron. Test., 2008

Online Sensor Testing through Superposition of Encoded Stimulus

Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson

CoRR, 2008

A novel method for test and calibration of capacitive accelerometers with a fully electrical setup.

Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

2007

Guest Editorial.

Marcelo Lubaszewski, Andrew Richardson, C. C. Su

J. Electron. Test., 2007

The Integration of On-Line Monitoring and Reconfiguration Functions using EDAA - European design and Automation Association1149.4 Into a Safety Critical Automotive Electronic Control Unit

Carl Jeffrey, Reuben Cutajar, Stephen Prosser, M. Lickess, Andrew Richardson, Stephen Riches

CoRR, 2007

A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus.

Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson

Proceedings of the 12th European Test Symposium, 2007

2006

Guest Editorial.

Salvador Mir, Kwang-Ting (Tim) Cheng, Andrew Richardson

J. Electron. Test., 2006

Investigation into the Use of Hybrid Solutions for SigmaDelta A/D Converter Testing.

Kostas Georgopoulos, Andreas Lechner, Martin John Burbidge, Andrew Richardson

J. Electron. Test., 2006

2005

The Integration of On-Line Monitoring and Reconfiguration Functions into a Safety Critical Automotive Electronic Control Unit.

Carl Jeffrey, Reuben Cutajar, Andrew Richardson, Stephen Prosser, M. Lickess, Stephen Riches

J. Electron. Test., 2005

Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor.

Carl Jeffrey, Zhou Xu, Andrew Richardson

Proceedings of the 10th European Test Symposium, 2005

The Integration of On-Line Monitoring and Reconfiguration Functions using IEEE1149.4 Into a Safety Critical Automotive Electronic Control Unit.

Carl Jeffrey, Reuben Cutajar, Stephen Prosser, M. Lickess, Andrew Richardson, Stephen Riches

Proceedings of the 2005 Design, 2005

2003

Investigations for Minimum Invasion Digital Only Built-In "Ramp" Based Test Techniques for Charge Pump PLL's.

Martin John Burbidge, Frédéric Poullet, Jim Tijou, Andrew Richardson

J. Electron. Test., 2003

Techniques for Automatic On Chip Closed Loop Transfer Function Monitoring For Embedded Charge Pump Phase Locked Loops.

Martin John Burbidge, Jim Tijou, Andrew Richardson

Proceedings of the 2003 Design, 2003

2001

3DB Challange for DfT, DfM, DOT & BIST Integration into Analogue and Mixed Signal ICs.

Andreas Lechner, Martin John Burbidge, Andrew Richardson, B. Hermes

Proceedings of the 2nd Latin American Test Workshop, 2001

Towards a better understanding of failure modes and test requirements of ADCs.

Andreas Lechner, Andrew Richardson, B. Hermes

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

Short Circuit Faults in State-of-the-Art ADCs - Are They Hard or Soft?

Andreas Lechner, Andrew Richardson, B. Hermes

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1999

A Digital Partial Built-In Self-Test for a High Performance Automatic Gain Control Circuit .

Andreas Lechner, J. Ferguson, Andrew Richardson, B. Hermes

Proceedings of the 1999 Design, 1999

1998

A Design for Testability Study on a High Performance Automatic Gain Control Circuit.

Andreas Lechner, Andrew Richardson, B. Hermes, Michael J. Ohletz

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Testing MEMS.

Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Design for testability strategies for mixed signal & analogue designs-from layout to system.

Andrew Richardson, Andreas Lechner, Thomas Olbrich

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998

An Approach to Realistic Fault Prediction and Layout Design for Testability in Analog Circuits.

Juan A. Prieto, Adoración Rueda, Ian Andrew Grout, Eduardo J. Peralías, José L. Huertas, Andrew Mark David Richardson

Proceedings of the 1998 Design, 1998

1997

A new quality estimation methodology for mixed-signal and analogue ICs.

Thomas Olbrich, Ian Andrew Grout, Y. Eben Aimine, Andrew Mark David Richardson, Jean-Noël Contensou

Proceedings of the European Design and Test Conference, 1997

1996

Design and Self-Test for Switched-Current Building Blocks.

Thomas Olbrich, Andrew Richardson

IEEE Des. Test Comput., 1996

Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs.

Thomas Olbrich, Jordi Pérez, Ian Andrew Grout, Andrew Mark David Richardson, Carles Ferrer

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

A design-for-test structure for optimising analogue and mixed signal IC test.

A. H. Bratt, Andrew Mark David Richardson, R. J. A. Harvey, A. P. Dorey

Proceedings of the 1995 European Design and Test Conference, 1995

1994

Analogue Fault Simulation Based on Layout-Dependent Fault Models.

R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Development of a CLASS 1 QTAG Monitor.

Keith Baker, A. H. Bratt, Andrew Richardson, A. Welbers

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1988

Reliability Testing by Precise Electrical Measurement.

A. P. Dorey, B. K. Jones, Andrew Mark David Richardson, P. C. Russell, Y. Z. Xu

Proceedings of the Proceedings International Test Conference 1988, 1988