Byunghyun Lee

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Known people with the same name:

Byunghyun Lee 001 (Purdue University, Elmore Family School of Electrical Engineering, School of Electrical and Computer Engineering, IN, USA)
Byunghyun Lee 002 (Samsung Electronics Company Ltd., System LSI Division, Yongin, Korea)

Bibliography

2025

A comparative analysis of job satisfaction prediction models using machine learning: a mixed-method approach.

[BibT_eX]

[DOI]

Data Technol. Appl., 2025

2024

Single Metal BCAT Breakthrough to Open a New Era of 12 nm DRAM and Beyond.

[BibT_eX]

[DOI]

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

14nm DRAM Development and Manufacturing.

[BibT_eX]

[DOI]

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2015

GPS/DR Error Estimation for Autonomous Vehicle Localization.

[BibT_eX]

[DOI]

Sensors, 2015

Curve modeled lane and stop line detection based GPS error estimation filter.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE Intelligent Vehicles Symposium, 2015

2014

Design technologies for a 1.2V 2.4Gb/s/pin high capacity DDR4 SDRAM with TSVs.

[BibT_eX]

[DOI]

Proceedings of the Symposium on VLSI Circuits, 2014

2013

A 1.2 V 30 nm 3.2 Gb/s/pin 4 Gb DDR4 SDRAM With Dual-Error Detection and PVT-Tolerant Data-Fetch Scheme.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, 2013

2012

A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012

2009

Thermal sensor allocation and placement for reconfigurable systems.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2009

Byunghyun Lee

Known people with the same name:

Bibliography

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