Davide Baroffio

According to our database, Davide Baroffio authored at least 13 papers between 2023 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2026

Late Breaking Results- Proton Beam Experiments of Compiler-based Hardware Fault Tolerance.

Emilio Corigliano, Davide Baroffio, Federico Reghenzani, Tomas Antonio López, William Fornaciari

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

VTS2026 Student Forum.

Davide Baroffio, Federico Reghenzani, William Fornaciari, Dipal Halder, Sandip Ray

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

Type Deduction Analysis: Reconstructing Transparent Pointer Types in LLVM-IR.

Niccolo Nicolosi, Gabriele Magnani, Emilio Corigliano, Davide Baroffio, Federico Reghenzani, Giovanni Agosta

Proceedings of the 35th ACM SIGPLAN International Conference on Compiler Construction, 2026

Quantifying Compiler-induced Reliability Loss in Software-Implemented Hardware Fault Tolerance.

Davide Baroffio, Johannes Geier, Federico Reghenzani, Ulf Schlichtmann, William Fornaciari

Proceedings of the 31st Asia and South Pacific Design Automation Conference, 2026

2025

Lavinium RAW Data.

Gabriele Magnani, Davide Baroffio, Federico Reghenzani, Giovanni Agosta, William Fornaciari

Dataset, September, 2025

Modern Llvm-Based Compiler Autotuning for Wcet Optimization.

Gabriele Magnani, Davide Baroffio, Federico Reghenzani, Giovanni Agosta, William Fornaciari

Proceedings of the IEEE Real-Time Systems Symposium, 2025

Laser and Radiation Testing of Compiler-Based Protection for Multi-Bit Upsets.

Davide Baroffio, Tomas Antonio López, Federico Reghenzani, William Fornaciari

Proceedings of the 43rd IEEE International Conference on Computer Design, 2025

Software Techniques for Soft Error Resilience: the ASTRAEUS project.

Federico Reghenzani, Davide Baroffio, Emilio Corigliano, William Fornaciari, Giancarlo Storti Gajani, Paolo Maffezzoni, Antonino Catanese, Alessandro Balossino, Marco Giuliani

Proceedings of the 28th Euromicro Conference on Digital System Design, 2025

Non-Functional Properties in HPC Systems: Design Exploration of Energy, Power, and Reliability.

Giovanni Agosta, Enrico Bini, Davide Baroffio, Carlo Brandolese, Michele Castrovilli, Daniele Cattaneo, Daniele Cesarini, William Fornaciari, Andrea Galimberti, Alberto Garfagnini, Arsenii Gavrikov, Francesco Iannone, Marco Lapegna, Tomas Antonio López, Gabriele Magnani, Gabriele Mencagli, Cecilia Metra, Martin Eugenio Omana, Filippo Palombi, Federico Reghenzani, Josie E. Rodriguez Condia, A. Serafini, Matteo Sonza Reorda, Davide Zoni, Giuseppe Zummo

Proceedings of the 28th Euromicro Conference on Digital System Design, 2025

Evaluating Compiler-Based Reliability with Radiation Fault Injection.

Davide Baroffio, Tomas Antonio López, Federico Reghenzani, William Fornaciari

Proceedings of the Design, Automation & Test in Europe Conference, 2025

2024

Enhanced Compiler Technology for Software-based Hardware Fault Detection.

Davide Baroffio, Federico Reghenzani, William Fornaciari

ACM Trans. Design Autom. Electr. Syst., 2024

2023

RISC-V-Based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters.

William Fornaciari, Federico Reghenzani, Federico Terraneo, Davide Baroffio, Cecilia Metra, Martin Omaña, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Robert Birke, Iacopo Colonnelli, Gianluca Mittone, Marco Aldinucci, Gabriele Mencagli, Francesco Iannone, Filippo Palombi, Giuseppe Zummo, Daniele Cesarini, Federico Tesser

Proceedings of the Embedded Computer Systems: Architectures, Modeling, and Simulation, 2023

Compiler-Injected SIHFT for Embedded Operating Systems.

Davide Baroffio, Federico Reghenzani

Proceedings of the 20th ACM International Conference on Computing Frontiers, 2023