Johannes Geier

According to our database, Johannes Geier authored at least 12 papers between 2021 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2026

Multi-Partner Project: A Holistic and Open-Source Approach to Efficient, Secure and Reliable AI Hardware Deployment in DI-EDAI.

Georgios Sotiropoulos, Felix Frombach, Julian Höfer, Tanja Harbaum, Jürgen Becker, Henrik Iver Thorøe, Vincent Meyers, Mehdi B. Tahoori, Zeynep Demirdag, Mohammed Bakr Sikal, Hassan Nassar, Heba Khdr, Jörrg Henkel, Christopher Wolters, Philipp van Kempen, Johannes Geier, Ulf Schlichtmann, Batuhan Sesli, Muhammad Sabih, Jakob Wittmann, Frank Hannig, Jürgen Teich, Lukas Steiner, Norbert Wehn, Mohamed Shelkamy Ali, Philipp Schmitz, Wolfgang Kunz, Stefan Koegler, Georg Sigl

Proceedings of the Design, Automation & Test in Europe Conference, 2026

Multi-Partner Project: Advancing European Semiconductor and Chiplet Innovation Through the Bavarian Chip Design Center.

Hussam Amrouch, Jehaan Joseph, Michael Schirmer, Johannes Geier, Ulf Schlichtmann, Michael Meidinger, Thomas Wild, Andreas Herkersdorf, Jens Nöpel, Georg Sigl, Yicheng Zhang, Carsten Trinitis, Aswathy Nedumpalli Sankaranarayanan, Martin Schulz, Andreas Korb, Konrad Hohentanner

Proceedings of the Design, Automation & Test in Europe Conference, 2026

Quantifying Compiler-induced Reliability Loss in Software-Implemented Hardware Fault Tolerance.

Davide Baroffio, Johannes Geier, Federico Reghenzani, Ulf Schlichtmann, William Fornaciari

Proceedings of the 31st Asia and South Pacific Design Automation Conference, 2026

2025

Automated Graph-level Passes for TinyML Fault Tolerance.

Johannes Kappes, Johannes Geier, Phillipp van Kempen, Daniel Mueller-Gritschneder, Ulf Schlichtmann

Proceedings of the International Joint Conference on Neural Networks, 2025

Rapid Fault Injection Simulation by Hash-Based Differential Fault Effect Equivalence Checks.

Johannes Geier, Leonidas Kontopoulos, Daniel Mueller-Gritschneder, Ulf Schlichtmann

Proceedings of the Design, Automation & Test in Europe Conference, 2025

Special Session - Hardware-Software Co-Design for Machine Learning Systems Made Open-Source.

Mehdi B. Tahoori, Vincent Meyers, Mahboobe Sadeghipour Roodsari, Huashuangyang Xu, Jürgen Becker, Tanja Harbaum, Felix Frombach, Julian Höfer, Georgios Sotiropoulos, Jörg Henkel, Zeynep Demirdag, Heba Khdr, Hassan Nassar, Ulf Schlichtmann, Johannes Geier, Philipp van Kempen, Georg Sigl, Stefan Koegler, Matthias Probst, Jürgen Teich, Frank Hannig, Muhammad Sabih, Batuhan Sesli, Norbert Wehn, Lukas Steiner, Wolfgang Kunz, Mohamed Shelkamy Ali

Proceedings of the International Conference on Hardware/Software Codesign and System Synthesis, 2025

Towards a Metric to Assess Neural Network Resilience Against Adversarial Samples.

Johannes Geier, Patrizia Heinl

Proceedings of the Availability, Reliability and Security, 2025

2024

XCP²: An XCP-Proxy Server for Concurrent Multinode XCP Access.

Michael Schirmer, David Maier, Johannes Geier

Proceedings of the 13th Mediterranean Conference on Embedded Computing, 2024

2023

vRTLmod: An LLVM based Open-source Tool to Enable Fault Injection in Verilator RTL Simulations.

Johannes Geier, Daniel Mueller-Gritschneder

Proceedings of the 20th ACM International Conference on Computing Frontiers, 2023

CompaSeC: A Compiler-Assisted Security Countermeasure to Address Instruction Skip Fault Attacks on RISC-V.

Johannes Geier, Lukas Auer, Daniel Mueller-Gritschneder, Uzair Sharif, Ulf Schlichtmann

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022

Key-Recovery Fault Injection Attack on the Classic McEliece KEM.

Sabine Pircher, Johannes Geier, Julian Danner, Daniel Mueller-Gritschneder, Antonia Wachter-Zeh

Proceedings of the Code-Based Cryptography - 10th International Workshop, 2022

2021

Exploring the RISC-V Vector Extension for the Classic McEliece Post-Quantum Cryptosystem.

Sabine Pircher, Johannes Geier, Alexander Zeh, Daniel Mueller-Gritschneder

Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021