Dimitri Lederer

According to our database, Dimitri Lederer authored at least 8 papers between 2003 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI.

Youssef Bendou, Martin Rack, Dimitri Lederer, Andreia Cathelin, Jean-Pierre Raskin

Proceedings of the 21st IEEE Interregional NEWCAS Conference, 2023

2021

RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications.

P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall

Proceedings of the IEEE International Reliability Physics Symposium, 2021

CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities.

Sachin Yadav, Pieter Cardinael, Ming Zhao, Komal Vondkar, Uthayasankaran Peralagu, AliReza Alian, Ahmad Khaled, Sergej Makovejev, Enrique Ekoga, Dimitri Lederer, Jean-Pierre Raskin, Bertrand Parvais, Nadine Collaert

Proceedings of the International Conference on IC Design and Technology, 2021

Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI.

Martin Rack, Lucas Nyssens, Quentin Courte, Dimitri Lederer, Jean-Pierre Raskin

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI.

Sameer H. Jain, Dimitri Lederer, Arvind Kumar, Sudesh Saroop, Chris Prindle, P. Srinivasan, Wen Liu, Ravi Achanta, Erdem Kaltalioglu, Stephen Moss, Greg Freeman, Paul Colestock

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates.

Pieter Cardinael, Sachin Yadav, Ming Zhao, Martin Rack, Dimitri Lederer, Nadine Collaert, Bertrand Parvais, Jean-Pierre Raskin

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2011

Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer.

C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, Dimitri Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin

Microelectron. Reliab., 2011

2003

DNA electrical detection based on inductor resonance frequency in standard CMOS technology.

G. Laurent, Luis Moreno Hagelsieb, Dimitri Lederer, P. E. Lobert, Denis Flandre, J. Remacle, Jean-Pierre Raskin

Proceedings of the ESSCIRC 2003, 2003