Ehrenfried Seebacher

According to our database1, Ehrenfried Seebacher authored at least 7 papers between 2008 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2017
Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits.
Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016
Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Analysis of substrate currents propagation in HVCMOS technology.
Proceedings of the 46th European Solid-State Device Research Conference, 2016

Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2011
An analytical approach for physical modeling of hot-carrier induced degradation.
Microelectron. Reliab., 2011

2010
Interface traps density-of-states as a vital component for hot-carrier degradation modeling.
Microelectron. Reliab., 2010

2008
Scalable High Voltage CMOS technology for Smart Power and sensor applications.
Elektrotech. Informationstechnik, 2008


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