Florian Klemme

According to our database, Florian Klemme authored at least 23 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Approximation- and Quantization-Aware Training for Graph Neural Networks.

Rodion Novkin, Florian Klemme, Hussam Amrouch

IEEE Trans. Computers, February, 2024

2023

Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs.

Florian Klemme, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., December, 2023

SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network.

Yuting Hu, Jiajie Li, Florian Klemme, Gi-Joon Nam, Tengfei Ma, Hussam Amrouch, Jinjun Xiong

Proceedings of the Advances in Neural Information Processing Systems 36: Annual Conference on Neural Information Processing Systems 2023, 2023

Robust Pattern Generation for Small Delay Faults Under Process Variations.

Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the IEEE International Test Conference, 2023

Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits.

Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level.

Behnaz Ranjbar, Florian Klemme, Paul R. Genssler, Hussam Amrouch, Jinhyo Jung, Shail Dave, Hwisoo So, Kyongwoo Lee, Aviral Shrivastava, Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Francky Catthoor, Dwaipayan Biswas, Akash Kumar

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection.

Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows.

Florian Klemme, Sami Salamin, Hussam Amrouch

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Design Automation for Cryogenic CMOS Circuits.

Victor M. van Santen, Marcel Walter, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Robert Wille, Hussam Amrouch

Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors.

Hussam Amrouch, Florian Klemme

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022

Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries.

Florian Klemme, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency.

Florian Klemme, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Variability-Aware Approximate Circuit Synthesis via Genetic Optimization.

Konstantinos Balaskas, Florian Klemme, Georgios Zervakis, Kostas Siozios, Hussam Amrouch, Jörg Henkel

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation.

Lilas Alrahis, Johann Knechtel, Florian Klemme, Hussam Amrouch, Ozgur Sinanoglu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU.

Sami Salamin, Georgios Zervakis, Florian Klemme, Hammam Kattan, Yogesh Singh Chauhan, Jörg Henkel, Hussam Amrouch

IEEE Trans. Computers, 2022

On Extracting Reliability Information from Speed Binning.

Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich

Proceedings of the IEEE European Test Symposium, 2022

Intelligent Methods for Test and Reliability.

Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

Design Close to the Edge for Advanced Technology using Machine Learning and Brain-Inspired Algorithms.

Hussam Amrouch, Florian Klemme, Paul R. Genssler

Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022

2021

Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization.

Florian Klemme, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

Machine Learning for Circuit Aging Estimation under Workload Dependency.

Florian Klemme, Hussam Amrouch

Proceedings of the IEEE International Test Conference, 2021

2020

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology.

Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities.

Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

Cell Library Characterization using Machine Learning for Design Technology Co-Optimization.

Florian Klemme, Yogesh Singh Chauhan, Jörg Henkel, Hussam Amrouch

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020