Toshiaki Kirihata

According to our database, Toshiaki Kirihata authored at least 28 papers between 1995 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

80-kb Logic Embedded High-K Charge Trap Transistor-Based Multi-Time-Programmable Memory With No Added Process Complexity.

Balaji Jayaraman, Derek Leu, Janakiraman Viraraghavan, Alberto Cestero, Ming Yin, John Golz, Rajesh Reddy Tummuru, Ramesh Raghavan, Dan Moy, Thejas Kempanna, Faraz Khan, Toshiaki Kirihata, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2018

14NM FinFET 1.5MB Embedded High-K Charge Trap Transistor One Time Programmable Memory Using Dynamic Adaptive Programming.

Eric Hunt-Schroeder, Darren Anand, John A. Fifield, Mark Jacunski, Michael Roberge, Dale E. Pontius, Kevin Batson, Toshiaki Kirihata

Proceedings of the 2018 IEEE Symposium on VLSI Circuits, 2018

2016

A 14 nm 1.1 Mb Embedded DRAM Macro With 1 ns Access.

Gregory Fredeman, Donald W. Plass, Abraham Mathews, Janakiraman Viraraghavan, Kenneth Reyer, Thomas J. Knips, Thomas Miller, Elizabeth L. Gerhard, Dinesh Kannambadi, Chris Paone, Dongho Lee, Daniel Rainey, Michael A. Sperling, Michael Whalen, Steven Burns, Rajesh Reddy Tummuru, Herbert Ho, Alberto Cestero, Norbert Arnold, Babar A. Khan, Toshiaki Kirihata, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2016

Three-Dimensional Dynamic Random Access Memories Using Through-Silicon-Vias.

Toshiaki Kirihata, John Golz, Matthew R. Wordeman, Pooja Batra, Gary W. Maier, Norman Robson, Troy L. Graves-abe, Daniel Berger, Subramanian S. Iyer

IEEE J. Emerg. Sel. Topics Circuits Syst., 2016

80Kb 10ns read cycle logic Embedded High-K charge trap Multi-Time-Programmable Memory scalable to 14nm FIN with no added process complexity.

Janakiraman Viraraghavan, Derek Leu, Balaji Jayaraman, Alberto Cestero, Robert Kilker, Ming Yin, John Golz, Rajesh Reddy Tummuru, Ramesh Raghavan, Dan Moy, Thejas Kempanna, Faraz Khan, Toshiaki Kirihata, Subramanian S. Iyer

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

2015

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications.

Chandrasekharan Kothandaraman, X. Chen, Dan Moy, D. Lea, Sami Rosenblatt, Faraz Khan, Derek Leu, Toshiaki Kirihata, D. Ioannou, Giuseppe La Rosa, J. B. Johnson, Norman Robson, Subramanian S. Iyer

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Advanced memory topics.

Toshiaki Kirihata, Dinesh Somasekhar

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2013

Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM.

Sami Rosenblatt, Daniel Fainstein, Alberto Cestero, John Safran, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2013

A Self-Authenticating Chip Architecture Using an Intrinsic Fingerprint of Embedded DRAM.

Sami Rosenblatt, Srivatsan Chellappa, Alberto Cestero, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2013

Advanced memory topics.

Koji Nii, Toshiaki Kirihata

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM.

Daniel Fainstein, Sami Rosenblatt, Alberto Cestero, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer

Proceedings of the Symposium on VLSI Circuits, 2012

2011

A 45 nm SOI Embedded DRAM Macro for the POWER™ Processor 32 MByte On-Chip L3 Cache.

John Barth, Don Plass, Erik Nelson, Charlie Hwang, Gregory Fredeman, Michael A. Sperling, Abraham Mathews, Toshiaki Kirihata, William R. Reohr, Kavita Nair, Nianzheng Cao

IEEE J. Solid State Circuits, 2011

Three Dimensional integration - Considerations for memory applications.

Subramanian S. Iyer, Toshiaki Kirihata, John E. Barth Jr.

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2009

A 1 MB Cache Subsystem Prototype With 1.8 ns Embedded DRAMs in 45 nm SOI CMOS.

Peter J. Klim, John Barth, William R. Reohr, David Dick, Gregory Fredeman, Gary Koch, Hien M. Le, Aditya Khargonekar, Pamela Wilcox, John Golz, Jente B. Kuang, Abraham Mathews, Jethro C. Law, Trong Luong, Hung C. Ngo, Ryan Freese, Hillery C. Hunter, Erik Nelson, Paul C. Parries, Toshiaki Kirihata, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2009

2008

A 500 MHz Random Cycle, 1.5 ns Latency, SOI Embedded DRAM Macro Featuring a Three-Transistor Micro Sense Amplifier.

John Barth, William R. Reohr, Paul C. Parries, Gregory Fredeman, John Golz, Stanley Schuster, Richard E. Matick, Hillery C. Hunter, Charles Tanner, Joseph Harig, Hoki Kim, Babar A. Khan, John Griesemer, Robert Havreluk, Kenji Yanagisawa, Toshiaki Kirihata, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2008

A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS.

Gregory Uhlmann, Tony Aipperspach, Toshiaki Kirihata, K. Chandrasekharan, Yan Zun Li, Chris Paone, Brian Reed, Norman Robson, John Safran, David Schmitt, Subramanian S. Iyer

Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

An on-chip dual supply charge pump system for 45nm PD SOI eDRAM.

Jente B. Kuang, Abraham Mathews, John Barth, Fadi H. Gebara, Tuyet Nguyen, Jeremy D. Schaub, Kevin J. Nowka, Gary D. Carpenter, Don Plass, Erik Nelson, Ivan Vo, William R. Reohr, Toshiaki Kirihata

Proceedings of the ESSCIRC 2008, 2008

2007

A 500MHz Random Cycle 1.5ns-Latency, SOI Embedded DRAM Macro Featuring a 3T Micro Sense Amplifier.

John Barth, William R. Reohr, Paul C. Parries, Gregory Fredeman, John Golz, Stanley Schuster, Richard E. Matick, Hillery C. Hunter, Charles Tanner, Joseph Harig, Hoki Kim, Babar A. Khan, John Griesemer, Robert Havreluk, Kenji Yanagisawa, Toshiaki Kirihata, Subramanian S. Iyer

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips.

Norman Robson, John Safran, Chandrasekharan Kothandaraman, Alberto Cestero, Xiang Chen, Raj Rajeevakumar, Alan Leslie, Dan Moy, Toshiaki Kirihata, Subramanian S. Iyer

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2005

An 800-MHz embedded DRAM with a concurrent refresh mode.

Toshiaki Kirihata, Paul C. Parries, David R. Hanson, Hoki Kim, John Golz, Gregory Fredeman, Raj Rajeevakumar, John Griesemer, Norman Robson, Alberto Cestero, Babar A. Khan, Geng Wang, Matt Wordeman, Subramanian S. Iyer

IEEE J. Solid State Circuits, 2005

2000

A 7F² cell and bitline architecture featuring tilted array devices and penalty-free vertical BL twists for 4-Gb DRAMs.

Heinz Hoenigschmid, Alexander Frey, John K. DeBrosse, Toshiaki Kirihata, Gerhard Mueller, Daniel W. Storaska, Gabriel Daniel, Gerd Frankowsky, Kevin P. Guay, David R. Hanson, Louis Lu-Chen Hsu, Brian Ji, Dmitry G. Netis, Steve Panaroni, Carl Radens, Armin M. Reith, Hartmud Terletzki, Oliver Weinfurtner, Johann Alsmeier, Werner Weber, Matthew R. Wordeman

IEEE J. Solid State Circuits, 2000

1999

A 390-mm², 16-bank, 1-Gb DDR SDRAM with hybrid bitline architecture.

Toshiaki Kirihata, Gerhard Mueller, Brian Ji, Gerd Frankowsky, John M. Ross, Hartmud Terletzki, Dmitry G. Netis, Oliver Weinfurtner, David R. Hanson, Gabriel Daniel, Louis Lu-Chen Hsu, Daniel W. Storaska, Armin M. Reith, Marco A. Hug, Kevin P. Guay, Manfred Selz, Peter Poechmueller, Heinz Hoenigschmid, Matthew R. Wordeman

IEEE J. Solid State Circuits, 1999

1998

A 220-mm², four- and eight-bank, 256-Mb SDRAM with single-sided stitched WL architecture.

Toshiaki Kirihata, Martin Gall, Kohji Hosokawa, Jean-Marc Dortu, Hing Wong, Peter Pfefferl, Brian L. Ji, Oliver Weinfurtner, John K. DeBrosse, Hartmud Terletzki, Manfred Selz, Wayne Ellis, Matthew R. Wordeman, Oliver Kiehl

IEEE J. Solid State Circuits, 1998

1997

Flexible test mode approach for 256-Mb DRAM.

Toshiaki Kirihata, Hing Wong, John K. DeBrosse, Yohji Watanabe, Takahiko Hara, Munehiro Yoshida, Matthew R. Wordeman, Shuso Fujii, Yoshiaki Asao, Bo Krsnik

IEEE J. Solid State Circuits, 1997

Development of a High Bandwidth Merged Logic/DRAM Multimedia Chip.

W. K. Luk, Yasunao Katayama, Wei Hwang, Matthew R. Wordeman, Toshiaki Kirihata, Akashi Satoh, Seiji Munetoh, Hing Wong, B. El-Kareh, P. Xiao, Rajiv V. Joshi

Proceedings of the Proceedings 1997 International Conference on Computer Design: VLSI in Computers & Processors, 1997

1996

A 286 mm² 256 Mb DRAM with ×32 both-ends DQ.

Yohji Watanabe, Ring Wong, Toshiaki Kirihata, Daisuke Kato, John K. DeBrosse, Takahiko Rara, Munehiro Yoshida, Rideo Mukai, Khandker N. Quader, Takeshi Nagai, Peter Poechmueller, Peter Pfefferl, Matthew R. Wordeman, Shuso Fujii

IEEE J. Solid State Circuits, 1996

Fault-tolerant designs for 256 Mb DRAM.

Toshiaki Kirihata, Yohji Watanabe, Hing Wong, John K. DeBrosse, Munehiro Yoshida, Daisuke Kato, Shuso Fujii, Matthew R. Wordeman, Peter Poechmueller, Stephen A. Parke, Yoshiaki Asao

IEEE J. Solid State Circuits, 1996

1995

A low-noise TTL-compatible CMOS off-chip driver circuit.

Sang H. Dhong, Masahiro Tanaka, Steven W. Tomashot, Toshiaki Kirihata

IBM J. Res. Dev., 1995