Giusy Iaria

According to our database, Giusy Iaria authored at least 8 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC.

Francesco Angione, Paolo Bernardi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre

IEEE Trans. Computers, September, 2025

A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs.

Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre

IEEE Trans. Computers, April, 2025

Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs.

Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre

Proceedings of the 26th IEEE Latin American Test Symposium, 2025

2023

About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics.

Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

2022

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.

Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the IEEE International Test Conference, 2022

A novel SEU injection setup for Automotive SoC.

Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022