Annachiara Ruospo

Orcid: 0000-0003-2040-9762

Affiliations:
  • Politecnico di Torino, Turin, Italy


According to our database1, Annachiara Ruospo authored at least 35 papers between 2018 and 2024.

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Bibliography

2024
SpikingJET: Enhancing Fault Injection for Fully and Convolutional Spiking Neural Networks.
CoRR, 2024

2023
A Survey on Deep Learning Resilience Assessment Methodologies.
Computer, February, 2023

Special Session: Approximation and Fault Resiliency of DNN Accelerators.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023

A Fault Injection Framework for AI Hardware Accelerators.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023

A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Evaluation and Mitigation of Faults Affecting Swin Transformers.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs.
Proceedings of the IEEE European Test Symposium, 2023

SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks.
Proceedings of the IEEE European Test Symposium, 2023

Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Investigating the effect of approximate multipliers on the resilience of a systolic array DNN accelerator.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

On the resilience of representative and novel data formats in CNNs.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator.
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks.
IEEE Trans. Emerg. Top. Comput., 2022

Machine learning for hardware security: Classifier-based identification of Trojans in pipelined microprocessors.
Appl. Soft Comput., 2022

Reliability Assessment Methodologies for ANN-based Systems.
Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022


Selective Hardening of Critical Neurons in Deep Neural Networks.
Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022

2021
Investigating data representation for efficient and reliable Convolutional Neural Networks.
Microprocess. Microsystems, October, 2021

Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks.
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

A Suitability Analysis of Software Based Testing Strategies for the On-line Testing of Artificial Neural Networks Applications in Embedded Devices.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

A Model-Based Framework to Assess the Reliability of Safety-Critical Applications.
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

A Benchmark Suite of RT-level Hardware Trojans for Pipelined Microprocessor Cores.
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

2020
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Simulation and Formal: The Best of Both Domains for Instruction Set Verification of RISC-V Based Processors.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

Evaluating Convolutional Neural Networks Reliability depending on their Data Representation.
Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020

A Pipelined Multi-Level Fault Injector for Deep Neural Networks.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019
On the Detection of Always-On Hardware Trojans Supported by a Pre-Silicon Verification Methodology.
Proceedings of the 20th International Workshop on Microprocessor/SoC Test, 2019

A Reliability Analysis of a Deep Neural Network.
Proceedings of the IEEE Latin American Test Symposium, 2019

A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips.
Proceedings of the IEEE International Test Conference, 2019

On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification.
Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018
An Open-Source Verification Framework for Open-Source Cores: A RISC-V Case Study.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018


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