Lucas M. Luza

According to our database, Lucas M. Luza authored at least 14 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Survey on Deep Learning Resilience Assessment Methodologies.

Annachiara Ruospo, Ernesto Sánchez, Lucas Matana Luza, Luigi Dilillo, Marcello Traiola, Alberto Bosio

Computer, February, 2023

2022

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks.

Lucas Matana Luza, Annachiara Ruospo, Daniel Söderström, Carlo Cazzaniga, Maria Kastriotou, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

IEEE Trans. Emerg. Top. Comput., 2022

Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices.

Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo

Proceedings of the IEEE European Test Symposium, 2022

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip.

Douglas A. dos Santos, André Martins Pio de Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks.

Annachiara Ruospo, Lucas Matana Luza, Alberto Bosio, Marcello Traiola, Luigi Dilillo, Ernesto Sánchez

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Characterization of a RISC-V System-on-Chip under Neutron Radiation.

Douglas A. dos Santos, Lucas M. Luza, Maria Kastriotou, Carlo Cazzaniga, Cesar A. Zeferino, Douglas R. Melo, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study.

Lucas Matana Luza, Daniel Söderström, André Martins Pio de Mattos, Eduardo Augusto Bezerra, Carlo Cazzaniga, Maria Kastriotou, Christian Poivey, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

A Model-Based Framework to Assess the Reliability of Safety-Critical Applications.

Lucas Matana Luza, Annachiara Ruospo, Alberto Bosio, Ernesto Sánchez, Luigi Dilillo

Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

2020

A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems.

Douglas Almeida dos Santos, Lucas Matana Luza, César Albenes Zeferino, Luigi Dilillo, Douglas Rossi de Melo

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM.

Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Alberto Bosio, Luigi Dilillo

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems.

Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites.

Cezar Antônio Rigo, Lucas M. Luza, Elder Dominghini Tramontin, Victor M. Goncalves Martins, Sara Vega Martínez, Leonardo Kessler Slongo, Laio Oriel Seman, Luigi Dilillo, Fabian Luis Vargas, Eduardo A. Bezerra

Proceedings of the IEEE Latin American Test Symposium, 2019

Design and Implementation of a Flexible Interface for TID Detector.

Iacopo Fara, Lucas Matana Luza, Jérôme Boch, Gianluca Furano, Marco Ottavi, Luigi Dilillo

Proceedings of the IEEE 8th International Workshop on Advances in Sensors and Interfaces, 2019

Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory.

Lucas Matana Luza, Alexandre Besser, Viyas Gupta, Arto Javanainen, Ali Mohammadzadeh, Luigi Dilillo

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019