Khader S. Abdel-Hafez

According to our database, Khader S. Abdel-Hafez authored at least 5 papers between 2004 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs.

Khader S. Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai

Proceedings of the IEEE International Test Conference, 2022

2011

State of the art low capture power methodology.

Swapnil Bahl, Roberto Mattiuzzo, Shray Khullar, Akhil Garg, S. Graniello, Khader S. Abdel-Hafez, Salvatore Talluto

Proceedings of the 2011 IEEE International Test Conference, 2011

2006

A New ATPG Method for Efficient Capture Power Reduction During Scan Testing.

Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction.

Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

VirtualScan: A New Compressed Scan Technology for Test Cost Reduction.

Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004