Anteneh Gebregiorgis
Orcid: 0000-0001-5909-4927Affiliations:
- Delft University of Technology, Department of Quantum and Computer Engineering, The Netherlands
- Karlsruhe Institute of Technology, ITEC, Germany
According to our database1,
Anteneh Gebregiorgis
authored at least 53 papers
between 2015 and 2024.
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Bibliography
2024
EON-1: A Brain-Inspired Processor for Near-Sensor Extreme Edge Online Feature Extraction.
CoRR, 2024
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
Proceedings of the 21st ACM International Conference on Computing Frontiers, 2024
Dynamic Detection and Mitigation of Read-disturb for Accurate Memristor-based Neural Networks.
Proceedings of the 6th IEEE International Conference on AI Circuits and Systems, 2024
2023
ACM J. Emerg. Technol. Comput. Syst., April, 2023
IEEE Trans. Emerg. Top. Comput. Intell., February, 2023
IEEE Trans. Biomed. Circuits Syst., February, 2023
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023
Proceedings of the Embedded Computer Systems: Architectures, Modeling, and Simulation, 2023
Proceedings of the International Conference on Microelectronics, 2023
Proceedings of the IEEE European Test Symposium, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the 5th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2023
2022
Neuromorph. Comput. Eng., 2022
A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs.
ACM J. Emerg. Technol. Comput. Syst., 2022
ACM J. Emerg. Technol. Comput. Syst., 2022
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE European Test Symposium, 2022
Proceedings of the IEEE European Test Symposium, 2022
CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out.
Proceedings of the 4th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2022
2021
Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic Systems.
ACM Trans. Design Autom. Electr. Syst., 2021
SRIF: Scalable and Reliable Integrate and Fire Circuit ADC for Memristor-Based CIM Architectures.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures.
Proceedings of the 29th IFIP/IEEE International Conference on Very Large Scale Integration, 2021
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
Proceedings of the 26th IEEE European Test Symposium, 2021
Proceedings of the 26th IEEE European Test Symposium, 2021
Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
Unbalanced Bit-slicing Scheme for Accurate Memristor-based Neural Network Architecture.
Proceedings of the 3rd IEEE International Conference on Artificial Intelligence Circuits and Systems, 2021
2020
Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation.
IEEE Trans. Very Large Scale Integr. Syst., 2020
2019
A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
Proceedings of the IEEE International Test Conference, 2018
Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
Balancing resiliency and energy efficiency of functional units in ultra-low power systems.
Proceedings of the 23rd Asia and South Pacific Design Automation Conference, 2018
2017
Proceedings of the 18th International Symposium on Quality Electronic Design, 2017
Proceedings of the 54th Annual Design Automation Conference, 2017
2016
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016
Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization.
Proceedings of the 2016 International Symposium on Low Power Electronics and Design, 2016
A cross-layer approach for resiliency and energy efficiency in near threshold computing.
Proceedings of the 35th International Conference on Computer-Aided Design, 2016
A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
2015
Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015