Rei-Fu Huang

According to our database, Rei-Fu Huang authored at least 23 papers between 2002 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Testing methods for quaternary content addressable memory using charge-sharing sensing scheme.

Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Testing methods for a write-assist disturbance-free dual-port SRAM.

Hao-Yu Yang, Chen-Wei Lin, Chao-Ying Huang, Ching-Ho Lu, Chen-An Lai, Mango Chia-Tso Chao, Rei-Fu Huang

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

2013

Fault Models and Test Methods for Subthreshold SRAMs.

Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Chin-Yuan Huang, Mango Chia-Tso Chao, Rei-Fu Huang

IEEE Trans. Computers, 2013

2012

Testing Methodology of Embedded DRAMs.

Hao-Yu Yang, Chi-Min Chang, Mango Chia-Tso Chao, Rei-Fu Huang, Shih-Chin Lin

IEEE Trans. Very Large Scale Integr. Syst., 2012

Alternate hammering test for application-specific DRAMs and an industrial case study.

Rei-Fu Huang, Hao-Yu Yang, Mango Chia-Tso Chao, Shih-Chin Lin

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2011

A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu

IEEE Trans. Very Large Scale Integr. Syst., 2011

2010

Fault models and test methods for subthreshold SRAMs.

Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Mango Chia-Tso Chao, Rei-Fu Huang

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Fault models for embedded-DRAM macros.

Mango Chia-Tso Chao, Hao-Yu Yang, Rei-Fu Huang, Shih-Chin Lin, Ching-Yu Chin

Proceedings of the 46th Design Automation Conference, 2009

2008

Testing Methodology of Embedded DRAMs.

Chi-Min Chang, Mango Chia-Tso Chao, Rei-Fu Huang, Ding-Yuan Chen

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Raisin: Redundancy Analysis Algorithm Simulation.

Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu

IEEE Des. Test Comput., 2007

Economic Aspects of Memory Built-in Self-Repair.

Rei-Fu Huang, Chao-Hsun Chen, Cheng-Wen Wu

IEEE Des. Test Comput., 2007

2005

A built-in self-repair design for RAMs with 2-D redundancy.

Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu

IEEE Trans. Very Large Scale Integr. Syst., 2005

2004

A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.

Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu

Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004

MRAM Defect Analysis and Fault Modeli.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

On Test and Diagnostics of Flash Memories.

Chih-Tsun Huang, Jen-Chieh Yeh, Yuan-Yuan Shih, Rei-Fu Huang, Cheng-Wen Wu

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

Fail Pattern Identification for Memory Built-In Self-Repair.

Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

SRAM delay fault modeling and test algorithm development.

Rei-Fu Huang, Yan-Ting Lai, Yung-Fa Chou, Cheng-Wen Wu

Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004

2003

A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories.

Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li

Proceedings of the 11th IEEE International Workshop on Memory Technology, 2003

A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy.

Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

A Processor-Based Built-In Self-Repair Design for Embedded Memories.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

Defect Oriented Fault Analysis for SRAM.

Rei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002

A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories.

Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories.

Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002