Koen Martens

According to our database, Koen Martens authored at least 3 papers between 2014 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices.

Abhitosh Vais, Koen Martens, Jacopo Franco, Dennis Lin, AliReza Alian, Philippe Roussel, S. Sioncke, Nadine Collaert, Aaron Thean, Marc M. Heyns, Guido Groeseneken, Kristin De Meyer

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions.

Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Determination of energy and spatial distribution of oxide border traps in In_0.53Ga_0.47As MOS capacitors from capacitance-voltage characteristics measured at various temperatures.

Chunmeng Dou, Dennis Lin, Abhitosh Vais, Tsvetan Ivanov, Han-Ping Chen, Koen Martens, Kuniyuki Kakushima, Hiroshi Iwai, Yuan Taur, Aaron Thean, Guido Groeseneken

Microelectron. Reliab., 2014