Takahiro Uchida

According to our database, Takahiro Uchida authored at least 6 papers between 2007 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Development of Taste Sensor to Detect Non-Charged Bitter Substances.

Jumpei Yoshimatsu, Kiyoshi Toko, Yusuke Tahara, Misaki Ishida, Masaaki Habara, Hidekazu Ikezaki, Honami Kojima, Saeri Ikegami, Miyako Yoshida, Takahiro Uchida

Sensors, 2020

2019

Compact Calibration-Free Eye-Tracking System for Students with Severe Physical and Intellectual Disabilities.

Iwao Kobayashi, Kiwamu Sato, Takahiro Uchida, Hiroshi Nunokawa

Proceedings of the 7th International conference on ICT & Accessibility, 2019

2018

Calibration-Free Eye- Tracking System in Education for Students with Severe Physical and Intellectual Disabilities.

Iwao Kobayashi, Kiwamu Sato, Nanami Chiba, Hiroshi Nunokawa, Takahiro Uchida

Proceedings of the IEEE International Conference on Teaching, 2018

2015

Surface interaction of microbubbles and applications of hydrogen-bubble method for cleaning and separation.

Koji Matsuura, Takahiro Uchida, Satoshi Ogawa, Chao Guan, Shinichiro Yanase

Proceedings of the 2015 International Symposium on Micro-NanoMechatronics and Human Science, 2015

2008

A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die.

Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Tsutomu Yoshihara, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara

IEEE J. Solid State Circuits, 2008

2007

A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die.

Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007