Vittorio Turco

According to our database, Vittorio Turco authored at least 8 papers between 2023 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Benchmark Suite for Resilience Assessment of Deep Learning Models.

Cristiana Bolchini, Alberto Bosio, Luca Cassano, Antonio Miele, Salvatore Pappalardo, Dario Passarello, Annachiara Ruospo, Ernesto Sánchez, Matteo Sonza Reorda, Vittorio Turco

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., January, 2026

2025

Reliability of Deep Neural Networks: Impact and Open Issues.

Annachiara Ruospo, Salvatore Pappalardo, Vittorio Turco, Alberto Bosio, Ernesto Sánchez

IEEE Des. Test, June, 2025

Special Session: Trustworthy Hardware-AI at the Cloud.

Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Sánchez, Arani Sinha, Vittorio Turco

Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

DOC: Detection of On-Line Failures in CNNs.

Vittorio Turco, Nicolò Bellarmino, Annachiara Ruospo, Riccardo Cantoro, Ernesto Sánchez

Proceedings of the 26th IEEE Latin American Test Symposium, 2025

A Benchmark Suite to Evaluate DNN's Resilience.

Cristiana Bolchini, Alberto Bosio, Luca Cassano, Antonio Miele, Salvatore Pappalardo, Dario Passariello, Annachiara Ruospo, Ernesto Sánchez, Matteo Sonza Reorda, Vittorio Turco

Proceedings of the IEEE International Test Conference, 2025

APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation.

Vittorio Turco, Lorenzo Fezza, Annachiara Ruospo, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2025

2024

Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics.

Vittorio Turco, Annachiara Ruospo, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems, 2024

2023

Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries.

Vittorio Turco, Annachiara Ruospo, Gabriele Gavarini, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023