Yasuhiro Konishi

According to our database, Yasuhiro Konishi authored at least 8 papers between 1992 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Highly Flexible Row and Column Redundancy and Cycle Time Adaptive Read Data Path for Double Data Rate Synchronous Memories.

Kiyohiro Furutani, Takeshi Hamamoto, Takeo Miki, Masaya Nakano, Takashi Kono, Shigeru Kikuda, Yasuhiro Konishi, Tsutomu Yoshihara

IEICE Trans. Electron., 2005

2004

A 667-Mb/s operating digital DLL architecture for 512-Mb DDR SDRAM.

Takeshi Hamamoto, Kiyohiro Furutani, Takashi Kubo, Satoshi Kawasaki, Hironori Iga, Takashi Kono, Yasuhiro Konishi, Tsutomu Yoshihara

IEEE J. Solid State Circuits, 2004

2000

A 0.18-μm 256-Mb DDR-SDRAM with low-cost post-mold tuning method for DLL replica.

Shigehiro Kuge, Tetsuo Kato, Kiyohiro Furutani, Shigeru Kikuda, Katsuyoshi Mitsui, Takeshi Hamamoto, Jun Setogawa, Kei Hamade, Yuichiro Komiya, Satoshi Kawasaki, Takashi Kono, Teruhiko Amano, Takashi Kubo, Masaru Haraguchi, Yoshito Nakaoka, Mihoko Akiyama, Yasuhiro Konishi, Hideyuki Ozaki, Tsutomu Yoshihara

IEEE J. Solid State Circuits, 2000

A precharged-capacitor-assisted sensing (PCAS) scheme with novel level controllers for low-power DRAMs.

Takashi Kono, Takeshi Hamamoto, Katsuyoshi Mitsui, Yasuhiro Konishi, Tsutomu Yoshihara, Hideyuki Ozaki

IEEE J. Solid State Circuits, 2000

1998

400-MHz random column operating SDRAM techniques with self-skew compensation.

Takeshi Hamamoto, Masaki Tsukude, Kazutami Arimoto, Yasuhiro Konishi, Takayuki Miyamoto, Hideyuki Ozaki, Michihiro Yamada

IEEE J. Solid State Circuits, 1998

1994

Testing 256k Word x 16 Bit Cache DRAM (CDRAM).

Yasuhiro Konishi, Toshiyuki Ogawa, Masaki Kumanoya

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters.

Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima

IEEE Des. Test Comput., 1993

1992

A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter.

Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsunori Suma, Kazuyasu Fujishima

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992