Michihiro Yamada

According to our database1, Michihiro Yamada authored at least 15 papers between 1985 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

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Bibliography

2021
Best Security Measures to Reduce Cyber-Incident and Data Breach Risks.
Proceedings of the Data Privacy Management, Cryptocurrencies and Blockchain Technology, 2021

2019
Development of a Cyber Incident Information Crawler.
Proceedings of the Innovative Mobile and Internet Services in Ubiquitous Computing, 2019

Mathematical Model to Estimate Loss by Cyber Incident in Japan.
Proceedings of the 5th International Conference on Information Systems Security and Privacy, 2019

2018
Evaluation and Development of Onomatopoeia CAPTCHAs.
Proceedings of the 16th Annual Conference on Privacy, Security and Trust, 2018

2017
How Much is Risk Increased by Sharing Credential in Group?
Proceedings of the Security and Trust Management - 13th International Workshop, 2017

Decision Tree Analysis on Environmental Factors of Insider Threats.
Proceedings of the HCI International 2017 - Posters' Extended Abstracts, 2017

Sharing or Non-sharing Credentials: A Study of What Motivates People to Be Malicious Insiders.
Proceedings of the Human Aspects of Information Security, Privacy and Trust, 2017

2001
Design methodology of embedded DRAM with virtual-socket architecture.
IEEE J. Solid State Circuits, 2001

1999
A 5.3-GB/s embedded SDRAM core with slight-boost scheme.
IEEE J. Solid State Circuits, 1999

Source-synchronization and timing vernier techniques for 1.2-GB/s SLDRAM interface.
IEEE J. Solid State Circuits, 1999

1998
A 5-MHz, 3.6-mW, 1.4-V SRAM with nonboosted, vertical bipolar bit-line contact memory cell.
IEEE J. Solid State Circuits, 1998

400-MHz random column operating SDRAM techniques with self-skew compensation.
IEEE J. Solid State Circuits, 1998

1997
High-speed/high-bandwidth design methodologies for on-chip DRAM core multimedia system LSI's.
IEEE J. Solid State Circuits, 1997

1991
An Address Maskable Parallel Testing for Ultra High Density DRAMs.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1985
Test Pattern Considerations for Fault Tolerant High Density DRAM.
Proceedings of the Proceedings International Test Conference 1985, 1985


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