Masanori Hayashikoshi

According to our database, Masanori Hayashikoshi authored at least 14 papers between 1992 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

An Energy-Efficient Task Scheduling for Near Real-Time Systems on Heterogeneous Multicore Processors.

Takashi Nakada, Hiroyuki Yanagihashi, Kunimaro Imai, Hiroshi Ueki, Takashi Tsuchiya, Masanori Hayashikoshi, Hiroshi Nakamura

IEICE Trans. Inf. Syst., 2020

2019

A Cost-Effective 1T-4MTJ Embedded MRAM Architecture with Voltage Offset Self-Reference Sensing Scheme for IoT Applications.

Masanori Hayashikoshi, Hiroaki Tanizaki, Yasumitsu Murai, Takaharu Tsuji, Kiyoshi Kawabata, Koji Nii, Hideyuki Noda, Hiroyuki Kondo, Yoshio Matsuda, Hideto Hidaka

IEICE Trans. Electron., 2019

2018

Low-Power Multi-Sensor System with Power Management and Nonvolatile Memory Access Control for IoT Applications.

Masanori Hayashikoshi, Hideyuki Noda, Hiroyuki Kawai, Yasumitsu Murai, Sugako Otani, Koji Nii, Yoshio Matsuda, Hiroyuki Kondo

IEEE Trans. Multi Scale Comput. Syst., 2018

A Cost-Effective High Accuracy Auto-Trimming System without Tester Constraint for Low-End Embedded Flash Memory.

Junichi Suzuki, Junichi Yamashita, Masami Hanyu, Masamichi Ido, Tatsuya Saito, Yasuhiro Nakashima, Masanori Hayashikoshi, Yukiyoshi Kiyota

Proceedings of the International SoC Design Conference, 2018

2017

An Energy-Efficient Task Scheduling for Near-Realtime Systems with Execution Time Variation.

Takashi Nakada, Tomoki Hatanaka, Hiroshi Ueki, Masanori Hayashikoshi, Toru Shimizu, Hiroshi Nakamura

IEICE Trans. Inf. Syst., 2017

Energy-aware task scheduling for near real-time periodic tasks on heterogeneous multicore processors.

Takashi Nakada, Hiroyuki Yanagihashi, Hiroshi Nakamura, Kunimaro Imai, Hiroshi Ueki, Takashi Tsuchiya, Masanori Hayashikoshi

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

Low-power multi-sensor system with task scheduling and autonomous standby mode transition control for IoT applications.

Masanori Hayashikoshi, Hideyuki Noda, Hiroyuki Kawai, Koji Nii, Hiroyuki Kondo

Proceedings of the 2017 IEEE Symposium in Low-Power and High-Speed Chips, 2017

2016

An adaptive energy-efficient task scheduling under execution time variation based on statistical analysis.

Takashi Nakada, Tomoki Hatanaka, Hiroshi Nakamura, Hiroshi Ueki, Masanori Hayashikoshi, Toru Shimizu

Proceedings of the 2016 IFIP/IEEE International Conference on Very Large Scale Integration, 2016

Low-power multi-sensor system with normally-off sensing technology for IoT applications.

Masanori Hayashikoshi, Hideyuki Noda, Hiroyuki Kawai, Hiroyuki Kondo

Proceedings of the International SoC Design Conference, 2016

2015

Energy-Efficient Continuous Task Scheduling for Near Real-Time Periodic Tasks.

Takashi Nakada, Hiroyuki Yanagihashi, Hiroshi Ueki, Takashi Tsuchiya, Masanori Hayashikoshi, Hiroshi Nakamura

Proceedings of the IEEE International Conference on Data Science and Data Intensive Systems, 2015

2014

Data-aware power management for periodic real-time systems with non-volatile memory.

Takashi Nakada, Takuya Shigematsu, Toshiya Komoda, Shinobu Miwa, Hiroshi Nakamura, Yohei Sato, Hiroshi Ueki, Masanori Hayashikoshi, Toru Shimizu

Proceedings of the IEEE Non-Volatile Memory Systems and Applications Symposium, 2014

Normally-off MCU architecture for low-power sensor node.

Masanori Hayashikoshi, Yohei Sato, Hiroshi Ueki, Hiroyuki Kawai, Toru Shimizu

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

1993

Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters.

Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima

IEEE Des. Test Comput., 1993

1992

A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter.

Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsunori Suma, Kazuyasu Fujishima

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992