Yves Rolain

According to our database, Yves Rolain authored at least 108 papers between 1994 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Forced Oscillation Technique Measurement Apparatus Using Fan-Speaker Hybrid.

Cedric Busschots, Johan Pattyn, Dries Peumans, Yves Rolain, Gerd Vandersteen

IEEE Trans. Instrum. Meas., 2022

2021

Adaptive Excitation Signals for Low-Frequency Forced Oscillation Technique Measurements in Patients.

Cedric Busschots, Andy Keymolen, Sylvia Verbanck, Daniël Schuermans, Hannes Maes, Dries Peumans, Johan Pattyn, Yves Rolain, Gerd Vandersteen, John Lataire

IEEE Trans. Instrum. Meas., 2021

2018

Distortion Contribution Analysis With the Best Linear Approximation.

Adam Cooman, Piet Bronders, Dries Peumans, Gerd Vandersteen, Yves Rolain

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Experimentally driven demystification of system identification for nonlinear mechanical systems.

Mark Vaes, Yves Rolain, Johan Pattyn, Gerd Vandersteen

IEEE Instrum. Meas. Mag., 2018

Fast Identification of Wiener-Hammerstein Systems using Discrete Optimization.

Maarten Schoukens, Gerd Vandersteen, Yves Rolain, Francesco Ferranti

CoRR, 2018

2016

Efficient and automated generation of multidimensional design curves for coupled-resonator filters using system identification and metamodels.

Matthias Caenepeel, Francesco Ferranti, Yves Rolain

Proceedings of the 13th International Conference on Synthesis, 2016

2015

Structure discrimination in block-oriented models using linear approximations: A theoretic framework.

Johan Schoukens, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Anne Van Mulders, Gerd Vandersteen

Autom., 2015

Parametric identification of parallel Wiener-Hammerstein systems.

Maarten Schoukens, Anna Marconato, Rik Pintelon, Gerd Vandersteen, Yves Rolain

Autom., 2015

A local approach for the modeling of linear parameter-varying systems based on transfer function interpolation with scaling coefficients.

Francesco Ferranti, Yves Rolain

Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

Wiener-Hammerstein systems and harmonic identification.

Laurent Baratchart, Matthias Caenepeel, Yves Rolain

Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

2014

Identification of Wiener-Hammerstein systems by a nonparametric separation of the best linear approximation.

Maarten Schoukens, Rik Pintelon, Yves Rolain

Autom., 2014

System identification in a real world.

Johan Schoukens, Anna Marconato, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Gerd Vandersteen, Anne Van Mulders

Proceedings of the IEEE 13th International Workshop on Advanced Motion Control, 2014

2013

Bounding the Polynomial Approximation Errors of Frequency Response Functions.

Johan Schoukens, Gerd Vandersteen, Rik Pintelon, Zlatko Emedi, Yves Rolain

IEEE Trans. Instrum. Meas., 2013

Design of Quasi-Logarithmic Multisine Excitations for Robust Broad Frequency Band Measurements.

Egon Geerardyn, Yves Rolain, Johan Schoukens

IEEE Trans. Instrum. Meas., 2013

An identification algorithm for parallel Wiener-Hammerstein systems.

Maarten Schoukens, Gerd Vandersteen, Yves Rolain

Proceedings of the 52nd IEEE Conference on Decision and Control, 2013

Study of the effective number of parameters in nonlinear identification benchmarks.

Anna Marconato, Maarten Schoukens, Yves Rolain, Johan Schoukens

Proceedings of the 52nd IEEE Conference on Decision and Control, 2013

Study of Small Data Set Efficiency Losses in System Identification: The FIR Case.

Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon

Proceedings of the 11th IFAC International Workshop on Adaptation and Learning in Control and Signal Processing, 2013

2012

Frequency Response Function Measurements Using Concatenated Subrecords With Arbitrary Length.

Johan Schoukens, Gerd Vandersteen, Yves Rolain, Rik Pintelon

IEEE Trans. Instrum. Meas., 2012

Parametric Identification of Parallel Wiener Systems.

Maarten Schoukens, Yves Rolain

IEEE Trans. Instrum. Meas., 2012

Cross-term Elimination in Parallel Wiener Systems Using a Linear Input Transformation.

Maarten Schoukens, Yves Rolain

IEEE Trans. Instrum. Meas., 2012

Exploiting the Phantom-Mode Signal in DSL Applications.

Wim Foubert, Carine Neus, Leo Van Biesen, Yves Rolain

IEEE Trans. Instrum. Meas., 2012

2011

Parametric Identification of Parallel Hammerstein Systems.

Maarten Schoukens, Rik Pintelon, Yves Rolain

IEEE Trans. Instrum. Meas., 2011

Binder Identification by Means of Phantom Measurements.

Carine Neus, Wim Foubert, Leo Van Biesen, Yves Rolain, Patrick Boets, Jochen Maes

IEEE Trans. Instrum. Meas., 2011

User friendly Box-Jenkins identification using nonparametric noise models.

Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon

Proceedings of the 50th IEEE Conference on Decision and Control and European Control Conference, 2011

Parametric MIMO parallel Wiener identification.

Maarten Schoukens, Yves Rolain

Proceedings of the 50th IEEE Conference on Decision and Control and European Control Conference, 2011

2010

Upper Bounding Variations of Best Linear Approximations of Nonlinear Systems in Power Sweep Measurements.

Johan Schoukens, Tadeusz P. Dobrowiecki, Yves Rolain, Rik Pintelon

IEEE Trans. Instrum. Meas., 2010

Modeling the Series Impedance of a Quad Cable for Common-Mode DSL Applications.

Wim Foubert, Carine Neus, Leo Van Biesen, Yves Rolain

IEEE Trans. Instrum. Meas., 2010

Substrate Noise Coupling Mechanisms in Lightly Doped CMOS Transistors.

Stephane Bronckers, Geert Van der Plas, Gerd Vandersteen, Yves Rolain

IEEE Trans. Instrum. Meas., 2010

A 0.5 mm ² Power-Scalable 0.5-3.8-GHz CMOS DT-SDR Receiver With Second-Order RF Band-Pass Sampler.

Arnd Geis, Julien Ryckaert, Lynn Bos, Gerd Vandersteen, Yves Rolain, Jan Craninckx

IEEE J. Solid State Circuits, 2010

Multirate Cascaded Discrete-Time Low-Pass ΔΣ Modulator for GSM/Bluetooth/UMTS.

Lynn Bos, Gerd Vandersteen, Pieter Rombouts, Arnd Geis, Alonso Morgado, Yves Rolain, Geert Van der Plas, Julien Ryckaert

IEEE J. Solid State Circuits, 2010

A fifth-order 880MHz/1.76GHz active lowpass filter for 60GHz communications in 40nm digital CMOS.

Piet Wambacq, Vito Giannini, Karen Scheir, Wim Van Thillo, Yves Rolain

Proceedings of the 36th European Solid-State Circuits Conference, 2010

An 11.6-19.3mW 0.375-13.6GHz CMOS frequency synthesizer with rail-to-rail operation.

Arnd Geis, Pierluigi Nuzzo, Julien Ryckaert, Yves Rolain, Gerd Vandersteen, Jan Craninckx

Proceedings of the Design, Automation and Test in Europe, 2010

On the use of parametric and non-parametric noise-models in time- and frequency domain system identification.

Johan Schoukens, Yves Rolain, Rik Pintelon

Proceedings of the 49th IEEE Conference on Decision and Control, 2010

2009

Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling.

Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens, Wendy Van Moer

IEEE Trans. Instrum. Meas., 2009

An Improved Broadband Conversion Scheme for the Large-Signal Network Analyzer.

Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2009

Experimental Analysis of the Coupling Mechanisms Between a 4 GHz PPA and a 5-7 GHz LC -VCO.

Stephane Bronckers, Gerd Vandersteen, Ludwig De Locht, Michael Libois, Geert Van der Plas, Yves Rolain

IEEE Trans. Instrum. Meas., 2009

Using ANOVA in a Microwave Round-Robin Comparison.

Kurt Barbé, Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2009

A Methodology to Predict the Impact of Substrate Noise in Analog/RF Systems.

Stephane Bronckers, Karen Scheir, Geert Van der Plas, Gerd Vandersteen, Yves Rolain

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

A Fully Integrated 7.3 kV HBM ESD-Protected Transformer-Based 4.5-6 GHz CMOS LNA.

Jonathan Borremans, Steven Thijs, Piet Wambacq, Yves Rolain, Dimitri Linten, Maarten Kuijk

IEEE J. Solid State Circuits, 2009

A 57-to-66GHz quadrature PLL in 45nm digital CMOS.

Karen Scheir, Gerd Vandersteen, Yves Rolain, Piet Wambacq

Proceedings of the IEEE International Solid-State Circuits Conference, 2009

A multirate 3.4-to-6.8mW 85-to-66dB DR GSM/bluetooth/UMTS cascade DT ΔΣM in 90nm digital CMOS.

Lynn Bos, Gerd Vandersteen, Julien Ryckaert, Pieter Rombouts, Yves Rolain, Geert Van der Plas

Proceedings of the IEEE International Solid-State Circuits Conference, 2009

2008

Identification of a Block-Structured Nonlinear Feedback System, Applied to a Microwave Crystal Detector.

Johan Schoukens, Liesbeth Gommé, Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2008

Estimation and Validation of Semiparametric Dynamic Nonlinear Models.

Yves Rolain, Wendy Van Moer, Johan Schoukens, Tom Dhaene

IEEE Trans. Instrum. Meas., 2008

Multisine Calibration for Large-Signal Broadband Measurements.

Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2008

A 52 GHz Phased-Array Receiver Front-End in 90 nm Digital CMOS.

Karen Scheir, Stephane Bronckers, Jonathan Borremans, Piet Wambacq, Yves Rolain

IEEE J. Solid State Circuits, 2008

Low-Area Active-Feedback Low-Noise Amplifier Design in Scaled Digital CMOS.

Jonathan Borremans, Piet Wambacq, Charlotte Soens, Yves Rolain, Maarten Kuijk

IEEE J. Solid State Circuits, 2008

A 52GHz Phased-Array Receiver Front-End in 90nm Digital CMOS.

Karen Scheir, Stephane Bronckers, Jonathan Borremans, Piet Wambacq, Yves Rolain

Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

2007

Measuring Nonlinear Differential RF Amplifiers Using One Single-Ended Source.

Yves Rolain, Wendy Van Moer, Johan Schoukens, Rik Pintelon

IEEE Trans. Instrum. Meas., 2007

On Peculiarities of S-Parameter Measurements.

Yves Rolain, Wendy Van Moer, Jeffrey A. Jargon, Donald C. DeGroot

IEEE Trans. Instrum. Meas., 2007

Fast Measurement of Quantization Distortions in DSP Algorithms.

Johan Paduart, Johan Schoukens, Yves Rolain

IEEE Trans. Instrum. Meas., 2007

Determining the Reciprocity of Mixers Through Three-Port Large Signal Network Analyzer Measurements.

Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2007

A switchable low-area 2.4-and-5 GHz dual-band LNA in digital CMOS.

Jonathan Borremans, Piet Wambacq, Geert Van der Plas, Yves Rolain, Maarten Kuijk

Proceedings of the 33rd European Solid-State Circuits Conference, 2007

Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's.

Stephane Bronckers, Charlotte Soens, Geert Van der Plas, Gerd Vandersteen, Yves Rolain

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis.

Jonathan Borremans, Ludwig De Locht, Piet Wambacq, Yves Rolain

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Leakage Reduction in Frequency-Response Function Measurements.

Johan Schoukens, Yves Rolain, Rik Pintelon

IEEE Trans. Instrum. Meas., 2006

Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations.

Ludwig De Locht, Gerd Vandersteen, Yves Rolain, Rik Pintelon

IEEE Trans. Instrum. Meas., 2006

Modeling of Substrate Noise Generation, Isolation, and Impact for an LC-VCO and a Digital Modem on a Lightly-Doped Substrate.

Charlotte Soens, Geert Van der Plas, Mustafa Badaroglu, Piet Wambacq, Stéphane Donnay, Yves Rolain, Maarten Kuijk

IEEE J. Solid State Circuits, 2006

Analysis of windowing/leakage effects in frequency response function measurements.

Johan Schoukens, Yves Rolain, Rik Pintelon

Autom., 2006

Box-Jenkins identification revisited - Part II: Applications.

Rik Pintelon, Yves Rolain, Johan Schoukens

Autom., 2006

Systematic stability-analysis method for analog circuits.

Gerd Vandersteen, Stephane Bronckers, Petr Dobrovolný, Yves Rolain

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005

Numerically robust transfer function modeling from noisy frequency domain data.

Adhemar Bultheel, Marc Van Barel, Yves Rolain, Rik Pintelon

IEEE Trans. Autom. Control., 2005

Identification of linear systems with nonlinear distortions.

Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki, Yves Rolain

Autom., 2005

Estimating Scalable Common-Denominator Laplace-Domain MIMO Models in an Errors-in-Variables Framework.

Gerd Vandersteen, Ludwig De Locht, Snezana Jenei, Yves Rolain, Rik Pintelon

Proceedings of the 2005 Design, 2005

2004

Why are nonlinear microwave systems measurements so involved?

Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Johan Schoukens

IEEE Trans. Instrum. Meas., 2004

Block-oriented instrument software design.

Yves Rolain, Wendy Van Moer

IEEE Trans. Instrum. Meas., 2004

Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations.

Rik Pintelon, Gerd Vandersteen, Ludwig De Locht, Yves Rolain, Johan Schoukens

IEEE Trans. Instrum. Meas., 2004

Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements.

Rik Pintelon, Yves Rolain, Gerd Vandersteen, Johan Schoukens

IEEE Trans. Instrum. Meas., 2004

Measuring the sensitivity of microwave components to bias variations.

Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2004

Box-Jenkins alike identification using nonparametric noise models.

Johan Schoukens, Rik Pintelon, Yves Rolain

Autom., 2004

Time domain identification, frequency domain identification. Equivalencies! Differences?

Johan Schoukens, Rik Pintelon, Yves Rolain

Proceedings of the 2004 American Control Conference, 2004

2003

Fully automated spectral analysis of periodic signals.

Johan Schoukens, Yves Rolain, Gyula Simon, Rik Pintelon

IEEE Trans. Instrum. Meas., 2003

Probability density function for frequency response function measurements using periodic signals.

Rik Pintelon, Yves Rolain, Wendy Van Moer

IEEE Trans. Instrum. Meas., 2003

Proving the usefulness of a three-port nonlinear vectorial network analyzer through mixer measurements.

Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2003

Discussion on fundamental issues of NPR measurements.

Alain Geens, Yves Rolain, Wendy Van Moer, Kenneth Vanhoenacker, Johan Schoukens

IEEE Trans. Instrum. Meas., 2003

Measuring in-band distortions of mixers.

Alain Geens, Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2003

Fast approximate identification of nonlinear systems.

Johan Schoukens, József G. Nemeth, Philippe Crama, Yves Rolain, Rik Pintelon

Autom., 2003

Uncertainty of transfer function modelling using prior estimated noise models.

Rik Pintelon, Johan Schoukens, Yves Rolain

Autom., 2003

2002

Broadband high-frequency hybrid.

Gerd Vandersteen, Alain R. F. Barel, Yves Rolain

IEEE Trans. Instrum. Meas., 2002

An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer.

Wendy Van Moer, Yves Rolain, Johan Schoukens

IEEE Trans. Instrum. Meas., 2002

Modified AIC rule for model selection in combination with prior estimated noise models.

Johan Schoukens, Yves Rolain, Rik Pintelon

Autom., 2002

2001

Static nonlinearity testing of digital-to-analog converters.

Balázs Vargha, Johan Schoukens, Yves Rolain

IEEE Trans. Instrum. Meas., 2001

An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions.

Gerd Vandersteen, Yves Rolain, Johan Schoukens

IEEE Trans. Instrum. Meas., 2001

Measuring mixed-signal substrate coupling.

Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Marc van Heijningen

IEEE Trans. Instrum. Meas., 2001

Identification of linear systems in the presence of nonlinear distortions.

Rik Pintelon, Johan Schoukens, Wendy Van Moer, Yves Rolain

IEEE Trans. Instrum. Meas., 2001

Modeling in the presence of switching uncertainties.

Wendy Van Moer, Yves Rolain, Rik Pintelon

IEEE Trans. Instrum. Meas., 2001

Measurement-based nonlinear modeling of spectral regrowth.

Wendy Van Moer, Yves Rolain, Alain Geens

IEEE Trans. Instrum. Meas., 2001

Noise figure measurements on nonlinear devices.

Alain Geens, Yves Rolain

IEEE Trans. Instrum. Meas., 2001

Obtaining accurate confidence regions for the estimated zeros and poles in system identification problems.

Rudi Vuerinckx, Rik Pintelon, Johan Schoukens, Yves Rolain

IEEE Trans. Autom. Control., 2001

Frequency response function measurements in the presence of nonlinear distortions.

Johan Schoukens, Rik Pintelon, Yves Rolain, Tadeusz P. Dobrowiecki

Autom., 2001

Efficient bit-error-rate estimation of multicarrier transceivers.

Gerd Vandersteen, Piet Wambacq, Yves Rolain, Johan Schoukens, Stéphane Donnay, Marc Engels, Ivo Bolsens

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

Robust rational approximation for identification.

Adhemar Bultheel, Marc Van Barel, Yves Rolain, Johan Schoukens

Proceedings of the 40th IEEE Conference on Decision and Control, 2001

2000

Broadband versus stepped sine FRF measurements.

Johan Schoukens, Rik Pintelon, Yves Rolain

IEEE Trans. Instrum. Meas., 2000

Box-Jenkins continuous-time modeling.

Rik Pintelon, Johan Schoukens, Yves Rolain

Autom., 2000

A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom transceivers.

Gerd Vandersteen, Piet Wambacq, Yves Rolain, Petr Dobrovolný, Stéphane Donnay, Marc Engels, Ivo Bolsens

Proceedings of the 37th Conference on Design Automation, 2000

1999

Identification of invariants of (over)parameterized models: finite sample results.

Rik Pintelon, Johan Schoukens, Gerd Vandersteen, Yves Rolain

IEEE Trans. Autom. Control., 1999

Study of conditional ML estimators in time and frequency-domain system identification.

Johan Schoukens, Rik Pintelon, Yves Rolain

Autom., 1999

Generating robust starting values for frequency-domain transfer function estimation.

Yves Rolain, Rik Pintelon

Autom., 1999

1998

Analyses, Development, and Applications of TLS Algorithms in Frequency Domain System Identification.

Rik Pintelon, Patrick Guillaume, Gerd Vandersteen, Yves Rolain

SIAM J. Matrix Anal. Appl., October, 1998

Measurements of harmonic distortion produced by a saturated optical amplifier with a nonlinear microwave network analyzer.

Philip Vael, Yves Rolain, Alain R. F. Barel, Andy Bliki

IEEE Trans. Instrum. Meas., 1998

Independent scaling of a delay in frequency-domain system identification.

Jeroen Strompf, István Kollár, Yves Rolain

IEEE Trans. Instrum. Meas., 1998

Improved frequency response function measurements for random noise excitations.

Johan Schoukens, Yves Rolain, Rik Pintelon

IEEE Trans. Instrum. Meas., 1998

Signal reconstruction for non-equidistant finite length sample sets: a "KIS" approach.

Yves Rolain, Johan Schoukens, Gerd Vandersteen

IEEE Trans. Instrum. Meas., 1998

1997

Order estimation for linear time-invariant systems using frequency domain identification methods.

Yves Rolain, Johan Schoukens, Rik Pintelon

IEEE Trans. Autom. Control., 1997

Non-parametric Estimation of the Frequency-response Functions of the Linear Blocks of a Wiener-Hammerstein Model.

Gerd Vandersteen, Yves Rolain, Johan Schoukens

Autom., 1997

1996

Design of stable IIR filters in the complex domain by automatic delay selection.

Rudi Vuerinckx, Yves Rolain, Johan Schoukens, Rik Pintelon

IEEE Trans. Signal Process., 1996

Minimum variance bounds for overparameterized models.

Rik Pintelon, Johan Schoukens, Tomas McKelvey, Yves Rolain

IEEE Trans. Autom. Control., 1996

1995

Best conditioned parametric identification of transfer function models in the frequency domain.

Yves Rolain, Rik Pintelon, K. Q. Xu, H. Vold

IEEE Trans. Autom. Control., 1995

1994

Parametric identification of transfer functions in the frequency domain-a survey.

Rik Pintelon, Patrick Guillaume, Yves Rolain, Johan Schoukens, Hugo Van hamme

IEEE Trans. Autom. Control., 1994