Dimitri Linten
According to our database1,
Dimitri Linten
authored at least 69 papers
between 2004 and 2023.
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Bibliography
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Physics-based device aging modelling framework for accurate circuit reliability assessment.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper.
Proceedings of the International Conference on IC Design and Technology, 2021
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS).
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS.
IEEE J. Solid State Circuits, 2019
Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Full (V<sub>g</sub>, V<sub>d</sub>) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {V<sub>G</sub>, V<sub>D</sub>} bias space.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2018
IACR Trans. Cryptogr. Hardw. Embed. Syst., 2018
Microelectron. Reliab., 2018
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability.
Microelectron. Reliab., 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2018
2017
Proceedings of the 47th European Solid-State Device Research Conference, 2017
Tunable ESD clamp for high-voltage power I/O pins of a battery charge circuit in mobile applications.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2016
Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC.
Microelectron. Reliab., 2016
2015
Proceedings of the Symposium on VLSI Circuits, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
The defect-centric perspective of device and circuit reliability - From individual defects to circuits.
Proceedings of the 45th European Solid State Device Research Conference, 2015
Characterization and simulation methodology for time-dependent variability in advanced technologies.
Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015
Proceedings of the 2015 International 3D Systems Integration Conference, 2015
2013
Quasi-3D method: Time-efficient TCAD and mixed-mode simulations on finFET technologies.
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013
2011
IEEE J. Solid State Circuits, 2011
2010
Proceedings of the IEEE International Solid-State Circuits Conference, 2010
Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - Challenges and solutions.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2010
2009
IEEE Trans. Instrum. Meas., 2009
Microelectron. Reliab., 2009
IEEE J. Solid State Circuits, 2009
2008
Advanced Planar Bulk and Multigate CMOS Technology: Analog-Circuit Benchmarking up to mm-Wave Frequencies.
Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008
Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications.
Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008
2007
IEEE Trans. Circuits Syst. I Regul. Pap., 2007
Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007
2006
Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions.
Microelectron. Reliab., 2006
2005
IEEE J. Solid State Circuits, 2005
Low-power voltage-controlled oscillators in 90-nm CMOS using high-quality thin-film postprocessed inductors.
IEEE J. Solid State Circuits, 2005
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005
2004
Proceedings of the 2004 Design, 2004
A 328 μW 5 GHz voltage-controlled oscillator in 90 nm CMOS with high-quality thin-film post-processed inductor.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004