Zahra Paria Najafi-Haghi

According to our database, Zahra Paria Najafi-Haghi authored at least 9 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Identifying Resistive Open Defects in Embedded Cells under Variations.

Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich

J. Electron. Test., February, 2023

Test Aspects of System Health State Monitoring.

Hans-Joachim Wunderlich, Hanieh Jafarzadeh, Alexandra Kourfali, Natalia Lylina, Zahra Paria Najafi-Haghi

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Robust Pattern Generation for Small Delay Faults Under Process Variations.

Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the IEEE International Test Conference, 2023

Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection.

Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022

Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning.

Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang

Proceedings of the IEEE International Test Conference, 2022

On Extracting Reliability Information from Speed Binning.

Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich

Proceedings of the IEEE European Test Symposium, 2022

Intelligent Methods for Test and Reliability.

Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Resistive Open Defect Classification of Embedded Cells under Variations.

Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Variation-Aware Defect Characterization at Cell Level.

Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich

Proceedings of the IEEE European Test Symposium, 2020