Chun-Kai Hsu

According to our database, Chun-Kai Hsu authored at least 9 papers between 2008 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Variation and failure characterization through pattern classification of test data from multiple test stages.

Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

AdaTest: An efficient statistical test framework for test escape screening.

Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng

Proceedings of the 2015 IEEE International Test Conference, 2015

Pairwise Proximity-Based Features for Test Escape Screening.

Fan Lin, Chun-Kai Hsu, Alberto Giovanni Busetto, Kwang-Ting Cheng

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

2014

Feature engineering with canonical analysis for effective statistical tests screening test escapes.

Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng

Proceedings of the 2014 International Test Conference, 2014

Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction.

Shuangyue Zhang, Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng, Hong Wang

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Learning from Production Test Data: Correlation Exploration and Feature Engineering.

Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Test data analytics - Exploring spatial and test-item correlations in production test data.

Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler

Proceedings of the 2013 IEEE International Test Conference, 2013

Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs.

Shin-Shiun Chen, Chun-Kai Hsu, Hsiu-Chuan Shih, Jen-Chieh Yeh, Cheng-Wen Wu

Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013

2008

Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.

Chun-Kai Hsu, Li-Ming Denq, Mao-Yin Wang, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu

Proceedings of the 17th IEEE Asian Test Symposium, 2008