Wangyang Zhang

According to our database, Wangyang Zhang authored at least 20 papers between 2008 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Attention Routing: track-assignment detailed routing using attention-based reinforcement learning.

Haiguang Liao, Qingyi Dong, Xuliang Dong, Wentai Zhang, Wangyang Zhang, Weiyi Qi, Elias Fallon, Levent Burak Kara

CoRR, 2020

2016

Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data.

Fa Wang, Paolo Cachecho, Wangyang Zhang, Shupeng Sun, Xin Li, Rouwaida Kanj, Chenjie Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

2013

Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression.

Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Test data analytics - Exploring spatial and test-item correlations in production test data.

Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler

Proceedings of the 2013 IEEE International Test Conference, 2013

Automatic clustering of wafer spatial signatures.

Wangyang Zhang, Xin Li, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.

Fa Wang, Wangyang Zhang, Shupeng Sun, Xin Li, Chenjie Gu

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012

IC Spatial Variation Modeling: Algorithms and Applications.

Wangyang Zhang

PhD thesis, 2012

Spatial variation decomposition via sparse regression.

Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Emrah Acar, Frank Liu, Rob A. Rutenbar

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

A dynamic method for efficient random mismatch characterization of standard cells.

Wangyang Zhang, Amith Singhee, Jinjun Xiong, Peter A. Habitz, Amol Joshi, Chandu Visweswariah, James Sundquist

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion.

Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun, Chenjie Gu

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Large-scale statistical performance modeling of analog and mixed-signal circuits.

Xin Li, Wangyang Zhang, Fa Wang

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits.

Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob A. Rutenbar, Ronald D. Blanton

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Test cost reduction through performance prediction using virtual probe.

Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler

Proceedings of the 2011 IEEE International Test Conference, 2011

Toward efficient spatial variation decomposition via sparse regression.

Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Rob A. Rutenbar

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

Parallel statistical capacitance extraction of on-chip interconnects with an improved geometric variation model.

Wenjian Yu, Chao Hu, Wangyang Zhang

Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011

2010

Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation.

Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob A. Rutenbar

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference.

Wangyang Zhang, Xin Li, Rob A. Rutenbar

Proceedings of the 47th Design Automation Conference, 2010

Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression.

Wangyang Zhang, Tsung-Hao Chen, Ming Yuan Ting, Xin Li

Proceedings of the 47th Design Automation Conference, 2010

2009

Variational capacitance extraction of on-chip interconnects based on continuous surface model.

Wenjian Yu, Chao Hu, Wangyang Zhang

Proceedings of the 46th Design Automation Conference, 2009

2008

An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation.

Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang, Jinjun Xiong

Proceedings of the Design, Automation and Test in Europe, 2008