Hsiu-Ming Chang
Affiliations:- Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA
According to our database1,
Hsiu-Ming Chang
authored at least 20 papers
between 2008 and 2013.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2018, "For contributions to power system modeling and analysis tools for protective relaying".
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2013
IEEE Trans. Very Large Scale Integr. Syst., 2013
2012
J. Electron. Test., 2012
2011
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
Proceedings of the 2011 IEEE International Test Conference, 2011
An all-digital built-in self-test technique for transfer function characterization of RF PLLs.
Proceedings of the Design, Automation and Test in Europe, 2011
Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers.
Proceedings of the 48th Design Automation Conference, 2011
A self-testing and calibration method for embedded successive approximation register ADC.
Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011
2010
IPSJ Trans. Syst. LSI Des. Methodol., 2010
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study.
J. Electron. Test., 2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 47th Design Automation Conference, 2010
2009
IEEE J. Solid State Circuits, 2009
Calibration and Testing Time Reduction Techniques for a Digitally-Calibrated Pipelined ADC.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009
Proceedings of the Eighteentgh Asian Test Symposium, 2009
2008
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008
Proceedings of the 17th IEEE Asian Test Symposium, 2008
Proceedings of the 17th IEEE Asian Test Symposium, 2008