Hanieh Jafarzadeh

According to our database, Hanieh Jafarzadeh authored at least 12 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage.

Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

J. Electron. Test., April, 2025

Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage.

Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 26th IEEE Latin American Test Symposium, 2025

Robust Pattern Generation for Small Delay Faults under the Impact of Variations.

Hanieh Jafarzadeh, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the IEEE European Test Symposium, 2025

2024

Vmin Testing under Variations: Defect vs. Fault Coverage.

Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing.

Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the IEEE International Test Conference, 2024

Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations.

Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the IEEE European Test Symposium, 2024

2023

Test Aspects of System Health State Monitoring.

Hans-Joachim Wunderlich, Hanieh Jafarzadeh, Alexandra Kourfali, Natalia Lylina, Zahra Paria Najafi-Haghi

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Robust Pattern Generation for Small Delay Faults Under Process Variations.

Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the IEEE International Test Conference, 2023

Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay Optimization.

Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm.

Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich

Proceedings of the 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2023

Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection.

Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022

Intelligent Methods for Test and Reliability.

Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022