Hongyang Hu

Orcid: 0000-0003-2291-9598

According to our database1, Hongyang Hu authored at least 12 papers between 2013 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2025
Development of an explainable machine learning model for predicting device-related pressure injuries in clinical settings.
BMC Medical Informatics Decis. Mak., December, 2025

An RRAM Digital Computing-in-Memory Macro With Dual-Mode Multiplication and Maximum Value Rounding Adder Tree.
IEEE Trans. Very Large Scale Integr. Syst., June, 2025

An Energy-Efficient High-Utilization Hardware Architecture for Attention Mechanism in Transformer using Balanced Systolic Array and Multi-Row Interleaved Operation Ordering.
Proceedings of the 62nd ACM/IEEE Design Automation Conference, 2025

2024
Write-Verify-Free MLC RRAM Using Nonbinary Encoding for AI Weight Storage at the Edge.
IEEE Trans. Very Large Scale Integr. Syst., February, 2024

34.9 A Flash-SRAM-ADC-Fused Plastic Computing-in-Memory Macro for Learning in Neural Networks in a Standard 14nm FinFET Process.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024

A 2T P-Channel Logic Flash Cell for Reconfigurable Interconnection in Chiplet-Based Computing-In-Memory Accelerators.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024

2023
A 40-nm SONOS Digital CIM Using Simplified LUT Multiplier and Continuous Sample-Hold Sense Amplifier for AI Edge Inference.
IEEE Trans. Very Large Scale Integr. Syst., December, 2023

A 28-nm RRAM Computing-in-Memory Macro Using Weighted Hybrid 2T1R Cell Array and Reference Subtracting Sense Amplifier for AI Edge Inference.
IEEE J. Solid State Circuits, October, 2023

High-speed and low-power embedded TEC BCH scheme for ReRAM array.
IEICE Electron. Express, 2023

2022
A 55nm 32Mb Digital Flash CIM Using Compressed LUT Multiplier and Low Power WL Voltage Trimming Scheme for AI Edge Inference.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2016
Study of total ionizing dose induced read bit errors in magneto-resistive random access memory.
Microelectron. Reliab., 2016

2013
An Online Multidomain Validation Method for Wireless Sensor Nodes.
Int. J. Distributed Sens. Networks, 2013


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