Hongyang Hu

According to our database, Hongyang Hu authored at least 8 papers between 2013 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Write-Verify-Free MLC RRAM Using Nonbinary Encoding for AI Weight Storage at the Edge.

Junjie An, Zhidao Zhou, Linfang Wang, Wang Ye, Weizeng Li, Hanghang Gao, Zhi Li, Jinghui Tian, Yan Wang, Hongyang Hu, Jinshan Yue, Lingyan Fan, Shibing Long, Qi Liu, Chunmeng Dou

IEEE Trans. Very Large Scale Integr. Syst., February, 2024

34.9 A Flash-SRAM-ADC-Fused Plastic Computing-in-Memory Macro for Learning in Neural Networks in a Standard 14nm FinFET Process.

Linfang Wang, Weizeng Li, Zhidao Zhou, Hanghang Gao, Zhi Li, Wang Ye, Hongyang Hu, Jing Liu, Jinshan Yue, Jianguo Yang, Qing Luo, Chunmeng Dou, Qi Liu, Ming Liu

Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2023

A 40-nm SONOS Digital CIM Using Simplified LUT Multiplier and Continuous Sample-Hold Sense Amplifier for AI Edge Inference.

Hongyang Hu, Xiwei Wang, Zi Wang, Haiyang Zhou, Danian Dong, Jinshan Yue, Wan Pang, Xiaoxin Xu, Chunmeng Dou

IEEE Trans. Very Large Scale Integr. Syst., December, 2023

A 28-nm RRAM Computing-in-Memory Macro Using Weighted Hybrid 2T1R Cell Array and Reference Subtracting Sense Amplifier for AI Edge Inference.

Wang Ye, Linfang Wang, Zhidao Zhou, Junjie An, Weizeng Li, Hanghang Gao, Zhi Li, Jinshan Yue, Hongyang Hu, Xiaoxin Xu, Jianguo Yang, Jing Liu, Dashan Shang, Feng Zhang, Jinghui Tian, Chunmeng Dou, Qi Liu, Ming Liu

IEEE J. Solid State Circuits, October, 2023

High-speed and low-power embedded TEC BCH scheme for ReRAM array.

Kun Zhang, Haiyang Liu, Xu Zheng, Xiaoxin Xu, Hongyang Hu, Junyu Zhang

IEICE Electron. Express, 2023

2022

A 55nm 32Mb Digital Flash CIM Using Compressed LUT Multiplier and Low Power WL Voltage Trimming Scheme for AI Edge Inference.

Hongyang Hu, Zi Wang, Xiaoxin Xu, Kai Xi, Kun Zhang, Junyu Zhang, Chunmeng Dou

Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2016

Study of total ionizing dose induced read bit errors in magneto-resistive random access memory.

Haohao Zhang, Jinshun Bi, Haibin Wang, Hongyang Hu, Jin Li, Lanlong Ji, Ming Liu

Microelectron. Reliab., 2016

2013

An Online Multidomain Validation Method for Wireless Sensor Nodes.

Changjian Deng, Dongyi Chen, Heng Zhang, Hongyang Hu, Jianzhong Lin

Int. J. Distributed Sens. Networks, 2013