Indradeep Ghosh

Orcid: 0000-0003-3146-4003

According to our database1, Indradeep Ghosh authored at least 50 papers between 1994 and 2022.

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Bibliography

2022
Scaling Vehicle Routing Problem Solvers with QUBO-based Specialized Hardware.
Proceedings of the 7th IEEE/ACM Symposium on Edge Computing, 2022

Towards Practical Explainability with Cluster Descriptors.
Proceedings of the IEEE International Conference on Data Mining Workshops, 2022

Partitioning Dense Graphs with Hardware Accelerators.
Proceedings of the Computational Science - ICCS 2022, 2022

2021
Ising-Based Louvain Method: Clustering Large Graphs with Specialized Hardware.
Proceedings of the Advances in Intelligent Data Analysis XIX, 2021

2020
Binary Matrix Factorization on Special Purpose Hardware.
CoRR, 2020

2017
KLOVER: Automatic Test Generation for C and C Programs, Using Symbolic Execution.
IEEE Softw., 2017

2016
FSX: a tool for fine-grained incremental unit test generation for C/C++ programs.
Proceedings of the 24th ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2016

FSX: fine-grained incremental unit test generation for C/C++ programs.
Proceedings of the 25th International Symposium on Software Testing and Analysis, 2016

2015
Generating Succinct Test Cases Using Don't Care Analysis.
Proceedings of the 8th IEEE International Conference on Software Testing, 2015

2014
SymJS: automatic symbolic testing of JavaScript web applications.
Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations of Software Engineering, (FSE-22), Hong Kong, China, November 16, 2014

2013
JST: an automatic test generation tool for industrial Java applications with strings.
Proceedings of the 35th International Conference on Software Engineering, 2013

Lazy Symbolic Execution through Abstraction and Sub-space Search.
Proceedings of the Hardware and Software: Verification and Testing, 2013

PASS: String Solving with Parameterized Array and Interval Automaton.
Proceedings of the Hardware and Software: Verification and Testing, 2013

2012
GKLEE: concolic verification and test generation for GPUs.
Proceedings of the 17th ACM SIGPLAN Symposium on Principles and Practice of Parallel Programming, 2012

2011
KLOVER: A Symbolic Execution and Automatic Test Generation Tool for C++ Programs.
Proceedings of the Computer Aided Verification - 23rd International Conference, 2011

2009
WEAVE: WEb Applications Validation Environment.
Proceedings of the 31st International Conference on Software Engineering, 2009

2008
Context-Sensitive Relevancy Analysis for Efficient Symbolic Execution.
Proceedings of the Programming Languages and Systems, 6th Asian Symposium, 2008

Verification Techniques for System-Level Design.
The Morgan Kaufmann series in systems on silicon, Morgan Kaufmann, ISBN: 978-0-12-370616-4, 2008

2006
A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

A Technique for Estimating the Difficulty of a Formal Verification Problem.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2005
High Level Test Generation for Custom Hardware: An Industrial Perspective.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004
High Level Design Validation: Current Practices and Future Directions.
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003
Efficient Sequential ATPG for Functional RTL Circuits.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Precomputation-based Guarding for Dynamic and Leakage Power Reduction.
Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003

On automatic generation of RTL validation test benches using circuit testing techniques.
Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, 2003

Automatic Design Validation Framework for HDL Descriptions via RTL ATPG.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

Event-driven observability enhanced coverage analysis of C programs for functional validation.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002
Design for Verification at the Register Transfer Level.
Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

2001
Fault-diagnosis-based technique for establishing RTL and gate-levelcorrespondences.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001

Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001

Observability enhanced coverage analysis of C programs for functional validation.
Proceedings of the Sixth IEEE International High-Level Design Validation and Test Workshop 2001, 2001

2000
A BIST scheme for RTL circuits based on symbolic testabilityanalysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

A fast and low-cost testing technique for core-based system-chips.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

Hierarchical Error Diagnosis Targeting RTL Circuits.
Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

A Technique for Identifying RTL and Gate-Level Correspondences.
Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, 2000

Automatic test pattern generation for functional RTL circuits using assignment decision diagrams.
Proceedings of the 37th Conference on Design Automation, 2000

1999
Hierarchical test generation and design for testability methods for ASPPs and ASIPs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

A low overhead design for testability and test generation technique for core-based systems-on-a-chip.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1998
A design-for-testability technique for register-transfer level circuits using control/data flow extraction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

High-level test synthesis: a survey.
Integr., 1998

Controller Resynthesis for Testability Enhancement of RTL Controller/Data Path Circuits.
J. Electron. Test., 1998

A BIST Scheme for RTL Controller-Data Paths Based on Symbolic Testability Analysis.
Proceedings of the 35th Conference on Design Automation, 1998

A Fast and Low Cost Testing Technique for Core-Based System-on-Chip.
Proceedings of the 35th Conference on Design Automation, 1998

1997
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

A Practical Method for Selecting Partial Scan Flip-flops for Large Circuits.
Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Hierarchical Test Generation and Design for Testability of ASPPs and ASIPs.
Proceedings of the 34st Conference on Design Automation, 1997

1996
A design for testability technique for RTL circuits using control/data flow extraction.
Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

1995
VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images.
Int. J. Pattern Recognit. Artif. Intell., 1995

1994
Design of an Application Specific VLSI Chip for Image Rotation.
Proceedings of the Seventh International Conference on VLSI Design, 1994


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