Chih-Wea Wang

According to our database1, Chih-Wea Wang authored at least 16 papers between 2000 and 2017.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.



In proceedings 
PhD thesis 




Optimization for application-specific packet-based on-chip interconnects using a cycle-accurate model.
Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017

Test for more than pass/fail using on-chip temperature sensor.
Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012

STEAC: A Platform for Automatic SOC Test Integration.
IEEE Trans. Very Large Scale Integr. Syst., 2007

An SOC Test Integration Platform and Its Industrial Realization.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Failure Factor Based Yield Enhancement for SRAM Designs.
Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

Test and Diagnosis of Word-Oriented Multiport Memories.
Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Fault Pattern Oriented Defect Diagnosis for Memories.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

FAME: A Fault-Pattern Based Memory Failure Analysis Framework.
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM.
J. Electron. Test., 2002

RAMSES-FT: A Fault Simulator for Flash Memory Testing and Diagnostics.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Test Scheduling of BISTed Memory Cores for SOC.
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

Test Scheduling and Test Access Architecture Optimization for System-on-Chip.
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

Simulation-Based Test Algorithm Generation and Port Scheduling for Multi-Port Memories.
Proceedings of the 38th Design Automation Conference, 2001

A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

Error Catch and Analysis for Semiconductor Memories Using March Tests.
Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000

A built-in self-test and self-diagnosis scheme for embedded SRAM.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000