Karen Maex

According to our database, Karen Maex authored at least 17 papers between 2000 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

Read Stability and Write-Ability Analysis of SRAM Cells for Nanometer Technologies.

Evelyn Grossar, Michele Stucchi, Karen Maex, Wim Dehaene

IEEE J. Solid State Circuits, 2006

Impact of interconnect resistance increase on system performance of low power and high performance designs.

Mandeep Bamal, Youssef Travaly, Wenqi Zhang, Michele Stucchi, Karen Maex

Proceedings of the Eigth International Workshop on System-Level Interconnect Prediction (SLIP 2006), 2006

Statistically Aware SRAM Memory Array Design.

Evelyn Grossar, Michele Stucchi, Karen Maex, Wim Dehaene

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2005

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure.

Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex

Microelectron. Reliab., 2005

Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability.

Yunlong Li, Zsolt Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex

Microelectron. Reliab., 2005

Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules.

Hua Wang, Miguel Miranda, Wim Dehaene, Francky Catthoor, Karen Maex

Proceedings of the 2005 Design, 2005

Analog and Digital Circuit Design in 65 nm CMOS: End of the Road?

Georges G. E. Gielen, Wim Dehaene, Phillip Christie, Dieter Draxelmayr, Edmond Janssens, Karen Maex, Ted Vucurevich

Proceedings of the 2005 Design, 2005

2004

Interconnect width selection for deep submicron designs using the table lookup method.

Mandeep Bamal, Evelyn Grossar, Michele Stucchi, Karen Maex

Proceedings of the Sixth International Workshop on System-Level Interconnect Prediction (SLIP 2004), 2004

How Can System-Level Design Solve the Interconnect Technology Scaling Problem?

Francky Catthoor, Andrea Cuomo, Grant Martin, Patrick Groeneveld, Rudy Lauwereins, Karen Maex, Patrick van de Steeg, Ron Wilson

Proceedings of the 2004 Design, 2004

2003

Global interconnect trade-off for technology over memory modules to application level: case study.

Antonis Papanikolaou, Miguel Miranda, Francky Catthoor, Henk Corporaal, Hugo De Man, David De Roest, Michele Stucchi, Karen Maex

Proceedings of the 5th International Workshop on System-Level Interconnect Prediction (SLIP 2003), 2003

2002

Frequency dependence in interline capacitance measurements.

Michele Stucchi, Karen Maex

IEEE Trans. Instrum. Meas., 2002

A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate.

Hasan Ymeri, Bart Nauwelaers, Karen Maex, Servaas Vandenberghe, David De Roest

Microprocess. Microsystems, 2002

Interconnect exploration for future wire dominated technologies.

Antonis Papanikolaou, Miguel Miranda, Francky Catthoor, Henk Corporaal, Hugo De Man, David De Roest, Michele Stucchi, Karen Maex

Proceedings of the Fourth IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2002), 2002

Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate.

Hasan Ymeri, Bart Nauwelaers, Karen Maex, David De Roest, Michele Stucchi, Servaas Vandenberghe

Proceedings of the 2002 Design, 2002

2001

Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate.

Hasan Ymeri, Bart Nauwelaers, Karen Maex

Integr., 2001

On the two-dimensional capacitance calculation of multiconductor multilayered interconnects.

Hasan Ymeri, Bart Nauwelaers, Karen Maex

Ann. des Télécommunications, 2001

2000

Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method.

Hasan Ymeri, Bart Nauwelaers, Karen Maex

Integr., 2000