Kazuki Monta

According to our database, Kazuki Monta authored at least 8 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection.

Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata

Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2024

2023

Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis.

Kazuki Monta, Lang Lin, Jimin Wen, Harsh Shrivastav, Calvin Chow, Hua Chen, Joao Geada, Sreeja Chowdhury, Nitin Pundir, Norman Chang, Makoto Nagata

ACM J. Emerg. Technol. Comput. Syst., January, 2023

Characterization of Backside ESD Impacts on Integrated Circuits.

Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Makoto Nagata

Proceedings of the IEEE International Reliability Physics Symposium, 2023

On the Unpredictability of SPICE Simulations for Side-Channel Leakage Verification of Masked Cryptographic Circuits.

Kazuki Monta, Makoto Nagata, Josep Balasch, Ingrid Verbauwhede

Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

2022

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements.

Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen

IEEE Des. Test, 2022

2021

Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification.

Lang Lin, Deqi Zhu, Jimin Wen, Hua Chen, Yu Lu, Norman Chang, Calvin Chow, Harsh Shrivastav, Chia-Wei Chen, Kazuki Monta, Makoto Nagata

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021

Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring.

Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis.

Lang Lin, Dinesh Selvakumaran, Deqi Zhu, Norman Chang, Calvin Chow, Makoto Nagata, Kazuki Monta

Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2020