Mauricio de Carvalho

According to our database, Mauricio de Carvalho authored at least 10 papers between 2010 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Innovative Techniques for Testing and Diagnosing SoCs.

Mauricio de Carvalho

PhD thesis, 2015

2014

Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test.

Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan

J. Electron. Test., 2014

2013

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption.

Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Miroslav Valka, Patrick Girard

J. Low Power Electron., 2013

Increasing fault coverage during functional test in the operational phase.

Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2012

On-line software-based self-test of the Address Calculation Unit in RISC processors.

Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan

Proceedings of the 17th IEEE European Test Symposium, 2012

Peak Power Estimation: A Case Study on CPU Cores.

Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard, Miroslav Valka

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez, Mauricio de Carvalho, Matteo Sonza Reorda

Proceedings of the 16th European Test Symposium, 2011

Optimized embedded memory diagnosis.

Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010

An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization.

Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the 11th International Workshop on Microprocessor Test and Verification, 2010

Cumulative embedded memory failure bitmap display & analysis.

Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone

Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010