Soyed Tuhin Ahmed

According to our database, Soyed Tuhin Ahmed authored at least 22 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Design-time Reference Current Generation for Robust Spintronic-based Neuromorphic Architecture.

Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

ACM J. Emerg. Technol. Comput. Syst., January, 2024

Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations.

Soyed Tuhin Ahmed, Kamal Danouchi, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

CoRR, 2024

Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning.

Soyed Tuhin Ahmed

CoRR, 2024

NeuSpin: Design of a Reliable Edge Neuromorphic System Based on Spintronics for Green AI.

Soyed Tuhin Ahmed, Kamal Danouchi, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

CoRR, 2024

Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks.

Soyed Tuhin Ahmed, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

CoRR, 2024

Concurrent Self-testing of Neural Networks Using Uncertainty Fingerprint.

Soyed Tuhin Ahmed, Mehdi Baradaran Tahoori

CoRR, 2024

2023

SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures.

Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

ACM Trans. Embed. Comput. Syst., October, 2023

Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration.

Soyed Tuhin Ahmed, Mehdi B. Tahoori

IEEE Des. Test, August, 2023

NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.

Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2023

SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation.

Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023

Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale.

Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

CoRR, 2023

Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation.

Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

CoRR, 2023

One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection.

Soyed Tuhin Ahmed, Mehdi B. Tahoori

CoRR, 2023

A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.

Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation.

Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2023

Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation.

Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022

Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration.

Soyed Tuhin Ahmed, Mehdi B. Tahoori

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices.

Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

Proceedings of the 17th ACM International Symposium on Nanoscale Architectures, 2022

Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking.

Soyed Tuhin Ahmed, Mehdi B. Tahoori

Proceedings of the IEEE International Test Conference, 2022

Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.

Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories.

Atousa Jafari, Mahta Mayahinia, Soyed Tuhin Ahmed, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

2021

NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.

Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 26th IEEE European Test Symposium, 2021