Tobias Kilian

Orcid: 0000-0001-7911-2889

According to our database¹, Tobias Kilian authored at least 18 papers between 2020 and 2025.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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PhD thesis

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On csauthors.net:

Bibliography

2025

Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2025

COSMO: COmpressed Sensing for Models and Logging Optimization in MCU Performance Screening.

[BibT_eX]

[DOI]

IEEE Trans. Computers, February, 2025

Grouped Feature Selection for SMONs Placement in MCU Performance Screening.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE Latin American Test Symposium, 2025

2024

On the Relation Between Reliability and Entropy in Physical Unclonable Functions.

[BibT_eX]

[DOI]

Vasilii Kulagin

Sergio Vinagrero Gutierrez

IEEE Des. Test, December, 2024

Embedded Feature Selection in MCU Performance Screening.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Design, 2024

2023

A Multilabel Active Learning Framework for Microcontroller Performance Screening.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

Performance Screening Using Functional Path Ring Oscillators.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., June, 2023

Feature Selection for Cost Reduction In MCU Performance Screening.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Semi-Supervised Deep Learning for Microcontroller Performance Screening.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2023

An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Enabling Inter-Product Transfer Learning on MCU Performance Screening.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2022

Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2022

2021

A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2021

Exploiting Active Learning for Microcontroller Performance Prediction.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2020

Tobias Kilian

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