Wenping Wang

Affiliations:

Vitesse Semiconductor, Austin, TX, USA
Arizona State University, Department of Electrical Engineering, Tempe, AZ, USA (PhD 2008)
Peking University, Microelectronics Department, Beijing, China (former)

According to our database¹, Wenping Wang authored at least 20 papers between 2005 and 2013.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

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PhD thesis

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On csauthors.net:

Bibliography

2013

NBTI-aware circuit node criticality computation.

[BibT_eX]

[DOI]

ACM J. Emerg. Technol. Comput. Syst., 2013

2011

Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2011

2010

The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2010

2009

<i>New-Age</i>: A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components.

[BibT_eX]

[DOI]

Michael DeBole

Krishnan Ramakrishnan

Narayanan Vijaykrishnan

Int. J. Parallel Program., 2009

The Predictive Technology Model in the Late Silicon Era and Beyond.

[BibT_eX]

[DOI]

Found. Trends Electron. Des. Autom., 2009

On the efficacy of input Vector Control to mitigate NBTI effects and leakage power.

[BibT_eX]

[DOI]

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

Gate replacement techniques for simultaneous leakage and aging optimization.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2009

A framework for estimating NBTI degradation of microarchitectural components.

[BibT_eX]

[DOI]

Michael DeBole

Krishnan Ramakrishnan

Narayanan Vijaykrishnan

Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008

Case Study of Reliability-Aware and Low-Power Design.

[BibT_eX]

[DOI]

Narayanan Vijaykrishnan

Yuan Xie

IEEE Trans. Very Large Scale Integr. Syst., 2008

Scalable model for predicting the effect of negative bias temperature instability for reliable design.

[BibT_eX]

[DOI]

IET Circuits Devices Syst., 2008

Optimized Circuit Failure Prediction for Aging: Practicality and Promise.

[BibT_eX]

[DOI]

Proceedings of the 2008 IEEE International Test Conference, 2008

Node Criticality Computation for Circuit Timing Analysis and Optimization under NBTI Effect.

[BibT_eX]

[DOI]

Wenping Wang

Shengqi Yang

Yu Cao

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

Statistical prediction of circuit aging under process variations.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007

An efficient method to identify critical gates under circuit aging.

[BibT_eX]

[DOI]

Proceedings of the 2007 International Conference on Computer-Aided Design, 2007

The Impact of NBTI on the Performance of Combinational and Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 44th Design Automation Conference, 2007

An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006

Modeling and minimization of PMOS NBTI effect for robust nanometer design.

[BibT_eX]

[DOI]

Rakesh Vattikonda

Wenping Wang

Yu Cao

Proceedings of the 43rd Design Automation Conference, 2006

Predictive Modeling of the NBTI Effect for Reliable Design.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits.

[BibT_eX]

[DOI]

Shengqi Yang

Wayne H. Wolf

Narayanan Vijaykrishnan

Yuan Xie

Wenping Wang

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Low-leakage robust SRAM cell design for sub-100nm technologies.

[BibT_eX]

[DOI]

Shengqi Yang

Wayne H. Wolf

Wenping Wang

Narayanan Vijaykrishnan

Yuan Xie

Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005

Wenping Wang

Timeline

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