Geoffrey Yeap

According to our database, Geoffrey Yeap authored at least 14 papers between 2010 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A 4.24GHz 128X256 SRAM Operating Double Pump Read Write Same Cycle in 5nm Technology.

Nick Zhang, Young Suk Kim, Peter Hsu, Samsoo Kim, Derek Tao, Hung-Jen Liao, Ping-Wei Wang, Geoffrey Yeap, Quincy Li, Tsung-Yung Jonathan Chang

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2021

A 5-nm 135-Mb SRAM in EUV and High-Mobility Channel FinFET Technology With Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-V_MIN Applications.

Tsung-Yung Jonathan Chang, Yen-Huei Chen, Wei-Min Chan, Hank Cheng, Po-Sheng Wang, Yangsyu Lin, Hidehiro Fujiwara, Robin Lee, Hung-Jen Liao, Ping-Wei Wang, Geoffrey Yeap, Quincy Li

IEEE J. Solid State Circuits, 2021

2020

15.1 A 5nm 135Mb SRAM in EUV and High-Mobility-Channel FinFET Technology with Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-VMIN Applications.

Jonathan Chang, Yen-Huei Chen, Gary Chan, Hank Cheng, Po-Sheng Wang, Yangsyu Lin, Hidehiro Fujiwara, Robin Lee, Hung-Jen Liao, Ping-Wei Wang, Geoffrey Yeap, Quincy Li

Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020

2016

Single Bit-Line 7T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Performance and Energy in 14 nm FinFET Technology.

Younghwi Yang, Hanwool Jeong, Seung Chul Song, Joseph Wang, Geoffrey Yeap, Seong-Ook Jung

IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Unified Technology Optimization Platform using Integrated Analysis (UTOPIA) for holistic technology, design and system co-optimization at <= 7nm nodes.

Seung Chul Song, J. Xu, D. Yang, K. Rim, P. Feng, Jerry Bao, J. Zhu, Joseph Wang, G. Nallapati, Mustafa Badaroglu, P. Narayanasetti, B. Bucki, Jeff Fischer, Geoffrey Yeap

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

-197dBc/Hz FOM 4.3-GHz VCO Using an addressable array of minimum-sized nmos cross-coupled transistor pairs in 65-nm CMOS.

Amit Jha, Ali Ahmadi, Sandeep Kshattry, T. Cao, K. Liao, Geoffrey Yeap, Yiorgos Makris, Kenneth K. O

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

2015

Single-Ended 9T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Read Performance in 22-nm FinFET Technology.

Younghwi Yang, Juhyun Park, Seung Chul Song, Joseph Wang, Geoffrey Yeap, Seong-Ook Jung

IEEE Trans. Very Large Scale Integr. Syst., 2015

SRAM Design for 22-nm ETSOI Technology: Selective Cell Current Boosting and Asymmetric Back-Gate Write-Assist Circuit.

Younghwi Yang, Juhyun Park, Seung Chul Song, Joseph Wang, Geoffrey Yeap, Seong-Ook Jung

IEEE Trans. Circuits Syst. I Regul. Pap., 2015

Holistic technology optimization and key enablers for 7nm mobile SoC.

Seung Chul Song, J. Xu, N. N. Mojumder, K. Rim, D. Yang, Jerry Bao, J. Zhu, Joseph Wang, Mustafa Badaroglu, V. Machkaoutsan, P. Narayanasetti, B. Bucki, Jeff Fischer, Geoffrey Yeap

Proceedings of the Symposium on VLSI Circuits, 2015

Transistor-interconnect mobile system-on-chip co-design method for holistic battery energy minimization.

N. N. Mojumder, Seung Chul Song, K. Rim, J. Xu, Joseph Wang, J. Zhu, Milena Vratonjic, K. Lin, Martin Saint-Laurent, Paul Bassett, Geoffrey Yeap

Proceedings of the Symposium on VLSI Circuits, 2015

2014

Improved device variability in scaled MOSFETs with deeply retrograde channel profile.

Jason Woo, Po-Yen Chien, Frank Yang, Seung Chul Song, P. R. Chidi Chidambaram, Joseph Wang, Geoffrey Yeap

Microelectron. Reliab., 2014

Technology-design-manufacturing co-optimization for advanced mobile SoCs.

Geoffrey Yeap

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2011

FinFET based SRAM bitcell design for 32 nm node and below.

Seung Chul Song, M. Abu-Rahma, Geoffrey Yeap

Microelectron. J., 2011

2010

BSIM4-based lateral diode model for LNA co-designed with ESD protection circuit.

Ming-Ta Yang, Yang Du, Charles Teng, Tony Chang, Eugene Worley, Ken Liao, You-Wen Yau, Geoffrey Yeap

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010