Rajeev R. Rao

According to our database1, Rajeev R. Rao authored at least 15 papers between 2003 and 2013.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2013
IBM POWER7+ design for higher frequency at fixed power.
IBM J. Res. Dev., 2013

2009
Circuit optimization techniques to mitigate the effects of soft errors in combinational logic.
ACM Trans. Design Autom. Electr. Syst., 2009

2007
Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

2006
Analytical yield prediction considering leakage/performance correlation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Logic SER Reduction through Flipflop Redesign.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

Soft error reduction in combinational logic using gate resizing and flipflop selection.
Proceedings of the 2006 International Conference on Computer-Aided Design, 2006

An efficient static algorithm for computing the soft error rates of combinational circuits.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005
Bus encoding for total power reduction using a leakage-aware buffer configuration.
IEEE Trans. Very Large Scale Integr. Syst., 2005

Modeling and Analysis of Parametric Yield under Power and Performance Constraints.
IEEE Des. Test Comput., 2005

An efficient surface-based low-power buffer insertion algorithm.
Proceedings of the 2005 International Symposium on Physical Design, 2005

2004
Statistical analysis of subthreshold leakage current for VLSI circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2004

Parametric yield estimation considering leakage variability.
Proceedings of the 41th Design Automation Conference, 2004

Leakage-and crosstalk-aware bus encoding for total power reduction.
Proceedings of the 41th Design Automation Conference, 2004

2003
Razor: A Low-Power Pipeline Based on Circuit-Level Timing Speculation.
Proceedings of the 36th Annual International Symposium on Microarchitecture, 2003

Statistical estimation of leakage current considering inter- and intra-die process variation.
Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003


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