Ruijun Ma

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Known people with the same name:

Bibliography

2025

SPADE-S: A Sparsity-Robust Foundational Forecaster.

[BibT_eX]

[DOI]

Shankar Ramasubramanian

CoRR, July, 2025

End-to-End Probabilistic Framework for Learning with Hard Constraints.

[BibT_eX]

[DOI]

CoRR, June, 2025

Highly Defect Detectable and SEU-Resilient Robust Scan-Test-Aware Latch Design.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., February, 2025

BatteryLife: A Comprehensive Dataset and Benchmark for Battery Life Prediction.

[BibT_eX]

[DOI]

CoRR, February, 2025

Semi-supervised lithography hotspot detection based on feature fusion and residual attention.

[BibT_eX]

[DOI]

Integr., 2025

A review of weed image identification based on deep few-shot learning.

[BibT_eX]

[DOI]

Comput. Electron. Agric., 2025

Towards end-to-end rice row detection in paddy fields exploiting two-pathway instance segmentation.

[BibT_eX]

[DOI]

Comput. Electron. Agric., 2025

2024

A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches.

[BibT_eX]

[DOI]

J. Electron. Test., February, 2024

Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments.

[BibT_eX]

[DOI]

Microelectron. J., January, 2024

♣ CLOVER ♣: Probabilistic Forecasting with Coherent Learning Objective Reparameterization.

[BibT_eX]

[DOI]

Trans. Mach. Learn. Res., 2024

A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements.

[BibT_eX]

[DOI]

Microelectron. J., 2024

A Low-Cost Triple-Node-Upset Self-Recovery Latch Design.

[BibT_eX]

[DOI]

J. Circuits Syst. Comput., 2024

Design of novel low cost triple-node-upset self-recoverable hardened latch.

[BibT_eX]

[DOI]

Integr., 2024

Three-dimensional localization and mapping of multiagricultural scenes via hierarchically-coupled LiDAR-inertial odometry.

[BibT_eX]

[DOI]

Comput. Electron. Agric., 2024

Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference in Asia, 2024

2023

PosNet: Estimating lettuce fresh weight in plant factory based on oblique image.

[BibT_eX]

[DOI]

Comput. Electron. Agric., October, 2023

Real-time missing seedling counting in paddy fields based on lightweight network and tracking-by-detection algorithm.

[BibT_eX]

[DOI]

Comput. Electron. Agric., September, 2023

LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy.

[BibT_eX]

[DOI]

Integr., 2023

Probabilistic Forecasting with Coherent Aggregation.

[BibT_eX]

[DOI]

CoRR, 2023

BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2023

2022

Evaluation and Test of Production Defects in Hardened Latches.

[BibT_eX]

[DOI]

IEICE Trans. Inf. Syst., 2022

Towards Broad Learning Networks on Unmanned Mobile Robot for Semantic Segmentation.

[BibT_eX]

[DOI]

Proceedings of the 2022 International Conference on Robotics and Automation, 2022

2021

Probabilistic Hierarchical Forecasting with Deep Poisson Mixtures.

[BibT_eX]

[DOI]

CoRR, 2021

PatentNet: A Large-Scale Incomplete Multiview, Multimodal, Multilabel Industrial Goods Image Database.

[BibT_eX]

[DOI]

CoRR, 2021

2019

STAHL: A Novel Scan-Test-Aware Hardened Latch Design.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

The impact of production defects on the soft-error tolerance of hardened latches.

[BibT_eX]

[DOI]

Stefan Holst

Ruijun Ma

Xiaoqing Wen

Proceedings of the 23rd IEEE European Test Symposium, 2018

Investigating the Impact of Gender on Rank in Resume Search Engines.

[BibT_eX]

[DOI]

Proceedings of the 2018 CHI Conference on Human Factors in Computing Systems, 2018

2017

Nonparametric maximum likelihood approximate message passing.

[BibT_eX]

[DOI]

Long Feng

Ruijun Ma

Lee H. Dicker

Proceedings of the 51st Annual Conference on Information Sciences and Systems, 2017

Ruijun Ma

Known people with the same name:

Bibliography

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