Felipe Augusto da Silva

According to our database, Felipe Augusto da Silva authored at least 8 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

Using STLs for Effective In-Field Test of GPUs.

Josie E. Rodriguez Condia, Felipe Augusto da Silva, Ahmet Çagri Bagbaga, Juan-David Guerrero-Balaguera, Said Hamdioui, Christian Sauer, Matteo Sonza Reorda

IEEE Des. Test, April, 2023

2021

An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

Proceedings of the IEEE International Test Conference, 2021

Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

2020

Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Sánchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer

Proceedings of the IEEE European Test Symposium, 2020

2019

Efficient Methodology for ISO26262 Functional Safety Verification.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Untestable faults identification in GPGPUs for safety-critical applications.

Josie E. Rodriguez Condia, Felipe Augusto da Silva, Said Hamdioui, Christian Sauer, Matteo Sonza Reorda

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

Proceedings of the 28th IEEE Asian Test Symposium, 2019